DocumentCode
3483098
Title
Carrier transport effects in undoped In0.35Ga0.65 As/GaAs MQW lasers determined from high-frequency impedance measurements
Author
Esquivias, I. ; Weisser, S. ; Romero, B. ; Tasker, P.J. ; Ralston, J.D. ; Rosenzweig, J. ; Arias, J.
Author_Institution
Dept. Tecnologia Electron., Univ. Politecnica de Madrid, Spain
Volume
2
fYear
1994
fDate
31 Oct-3 Nov 1994
Firstpage
161
Abstract
The authors have recently reported the use of high-frequency impedance measurements to obtain information about the carrier capture/re-emission processes in ultra-high-speed (30 GHz modulation bandwidth) p-doped In0.35Ga0.65As/GaAs MQW lasers. By using this approach the authors demonstrated: i) that the interplay between carrier capture and re-emission is not strongly affecting the high-speed modulation dynamics of these devices; and ii) that a bias dependent RC like roll-off with an associated time constant τ0 , is still limiting the modulation bandwidth. In the paper the authors apply the impedance method to lasers with the same epilayer structure as those reported previously, but with nominally undoped active layers. In addition to the time constant τ0 they were able to extract the carrier re-emission time out of the QWs, τ esc, and the effective carrier lifetime in the QWs, τeff
Keywords
quantum well lasers; 30 GHz; In0.35Ga0.65As-GaAs; In0.35Ga0.65As/GaAs; MQW lasers; bias dependent RC like roll-off; carrier capture; carrier capture/re-emission processes; carrier re-emission; carrier re-emission time; carrier transport effects; effective carrier lifetime; epilayer structure; high-frequency impedance measurements; high-speed modulation dynamics; impedance method; modulation bandwidth; time constant; ultra-high-speed laser; undoped active layers; Bandwidth; Charge carrier lifetime; Diodes; Electric resistance; Frequency; Gallium arsenide; Geometrical optics; Impedance measurement; Quantum well devices; Threshold current;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Society Annual Meeting, 1994. LEOS '94 Conference Proceedings. IEEE
Conference_Location
Boston, MA
Print_ISBN
0-7803-1470-0
Type
conf
DOI
10.1109/LEOS.1994.586381
Filename
586381
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