• DocumentCode
    3483250
  • Title

    Sensitivity techniques for the fast assessment of security margins to voltage collapse

  • Author

    Zarate, Luis A Ll ; Castro, Carlos A.

  • Author_Institution
    Univ. of Campinas, Sao Paulo
  • fYear
    2005
  • fDate
    27-30 June 2005
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    This paper presents a simple, fast and efficient method for determining the security margin to voltage collapse (SMVC) of electric power systems. The computation procedure is based on the utilization of sensitivity techniques. The basic idea is that load increments influence the behavior of the reactive power injected by generators (slack and PV buses). Therefore, sensitivity analysis may be a very interesting tool for voltage stability analysis and applications. The proposed method, with a static approach, is based on solving a certain number of load flow calculations for different load levels. The path to reaching the maximum loading point, which allows the estimation of the SMVC consists of simple load increments or curtailments. The results are accurately obtained after a few load change steps.
  • Keywords
    load flow; power system dynamic stability; power system security; reactive power; sensitivity analysis; electric power systems; fast assessment security margins; load flow calculations; reactive power; security margins to voltage collapse; sensitivity techniques; voltage stability analysis; Information security; Power system analysis computing; Power system interconnection; Power system modeling; Power system planning; Power system security; Power system stability; Sensitivity analysis; Stability analysis; Voltage; Power systems security; maximum loading point; security margins; sensitivity analysis; voltage collapse; voltage stability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Tech, 2005 IEEE Russia
  • Conference_Location
    St. Petersburg
  • Print_ISBN
    978-5-93208-034-4
  • Electronic_ISBN
    978-5-93208-034-4
  • Type

    conf

  • DOI
    10.1109/PTC.2005.4524500
  • Filename
    4524500