DocumentCode
3483292
Title
Handling high dimensionality in biometric classification with multiple quality measures using Locality Preserving Projection
Author
Kryszczuk, Krzysztof ; Poh, Norman
Author_Institution
IBM Zurich Res. Lab., Zurich, Switzerland
fYear
2010
fDate
13-18 June 2010
Firstpage
146
Lastpage
153
Abstract
The use of quality measures in biometrics is rapidly becoming the standard strategy for improving performance of biometric systems, especially in the presence of variable environmental conditions of signal capture. It is often necessary to integrate multiple quality measures into the classification process in order to capture the relevant aspects of signal quality. The inclusion of multiple quality features quickly increases the dimensionality of the classification problem, which leads to the risks of overfitting and dimensionality curse. So far, no mature strategy of coping with multiple quality measures has been developed. In this paper we propose to use a scheme, where the dimensionality of the vector of quality measures is reduced using the Locality Preserving Projections. We show that the proposed technique offers higher accuracy and better generalization properties than existing techniques of classification with quality measures, in same- and cross-device biometric matching scenarios.
Keywords
biometrics (access control); face recognition; image matching; sensor fusion; vectors; biometric classification; biometric matching; locality preserving projection; multiple quality measures; Accuracy; Biometrics; Degradation; Measurement standards; Signal processing; Statistical learning; System performance; Training data;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition Workshops (CVPRW), 2010 IEEE Computer Society Conference on
Conference_Location
San Francisco, CA
ISSN
2160-7508
Print_ISBN
978-1-4244-7029-7
Type
conf
DOI
10.1109/CVPRW.2010.5544619
Filename
5544619
Link To Document