• DocumentCode
    3483313
  • Title

    The Ibis 1000 SIMOX production implanter

  • Author

    Ryding, G. ; Smick, T.H. ; Farley, M. ; Cordts, B.F. ; Dolan, R.P. ; Allen, L.P. ; Mathews, B. ; Wray, W. ; Amundsen, B. ; Anc, M.J.

  • Author_Institution
    Ibis Technol. Corp., Danvers, MA, USA
  • fYear
    1996
  • fDate
    16-21 Jun 1996
  • Firstpage
    436
  • Lastpage
    439
  • Abstract
    The second generation of the Ibis 1000 production implanter has been used in the manufacture of SIMOX wafers since June 1995. High quality 150 and 200 mm SIMOX wafers are being produced with excellent implant uniformity and repeatability. The system includes a newly designed ion source, analyzer, beam scan system, and vacuum loadlock robotic wafer handler. Wafer temperature is maintained through a servo-controlled heat lamp array during implantation. The beam is scanned at a rate of 150 Hz across a circular array of wafers held by pedestals in a hub and spoke arrangement rotating at 105 rpm. The ion beam is only allowed to impinge on silicon in the regions upstream and downstream of the implant plane to prevent metallic contamination and particulate generation. The wafer holders individually rotate to set implant angle and to facilitate horizontal handling by an in-vacuum robot. In this paper we describe the essential features of the Ibis 1000 implanter along with its performance characteristics and discuss the quality of material produced using this system
  • Keywords
    SIMOX; ion implantation; 150 Hz; 150 mm; 200 mm; Ibis 1000 production implanter; SIMOX wafer manufacture; analyzer; beam scan system; ion source; servo-controlled heat lamp array; vacuum loadlock robotic wafer handler; Implants; Ion beams; Ion sources; Lamps; Manufacturing; Production; Robots; Silicon; Temperature; Vacuum systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ion Implantation Technology. Proceedings of the 11th International Conference on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    0-7803-3289-X
  • Type

    conf

  • DOI
    10.1109/IIT.1996.586391
  • Filename
    586391