• DocumentCode
    3483395
  • Title

    Factors affecting the design of the Applied Materials xR80 implant family

  • Author

    Lowrie, C. ; England, J. ; Hunter, A. ; Burgin, D. ; Harrison, B.

  • Author_Institution
    Implant Div., Appl. Mater., Horsham, UK
  • fYear
    1996
  • fDate
    16-21 Jun 1996
  • Firstpage
    447
  • Lastpage
    449
  • Abstract
    This paper describes the assumptions made and solutions adopted by the xR80 design team in an attempt to optimise the overall cost performance ratio of the system, by design. The beamline design will be described in detail, together with the factors which increase low energy beam current transmission. New ion source and extraction technology have been key in producing high beam currents, concurrent with low maintenance intervals. To minimise the system footprint, several creative approaches have been taken in design of the beamline and also the handling system, particularly since the dimensional characteristics are to be maintained in the transition to 300 mm wafer size. These factors, together with the solutions adopted to maintain system maintainability will be described in detail in the paper
  • Keywords
    ion implantation; 300 mm; Applied Materials xR80 implanter; beamline design; cost performance ratio; handling system; ion extraction; ion source; low energy beam current transmission; maintainability; system footprint; Costs; Design optimization; Doping; Foundries; Implants; Ion beams; Ion sources; Manufacturing processes; Optical beams; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ion Implantation Technology. Proceedings of the 11th International Conference on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    0-7803-3289-X
  • Type

    conf

  • DOI
    10.1109/IIT.1996.586394
  • Filename
    586394