DocumentCode
3483395
Title
Factors affecting the design of the Applied Materials xR80 implant family
Author
Lowrie, C. ; England, J. ; Hunter, A. ; Burgin, D. ; Harrison, B.
Author_Institution
Implant Div., Appl. Mater., Horsham, UK
fYear
1996
fDate
16-21 Jun 1996
Firstpage
447
Lastpage
449
Abstract
This paper describes the assumptions made and solutions adopted by the xR80 design team in an attempt to optimise the overall cost performance ratio of the system, by design. The beamline design will be described in detail, together with the factors which increase low energy beam current transmission. New ion source and extraction technology have been key in producing high beam currents, concurrent with low maintenance intervals. To minimise the system footprint, several creative approaches have been taken in design of the beamline and also the handling system, particularly since the dimensional characteristics are to be maintained in the transition to 300 mm wafer size. These factors, together with the solutions adopted to maintain system maintainability will be described in detail in the paper
Keywords
ion implantation; 300 mm; Applied Materials xR80 implanter; beamline design; cost performance ratio; handling system; ion extraction; ion source; low energy beam current transmission; maintainability; system footprint; Costs; Design optimization; Doping; Foundries; Implants; Ion beams; Ion sources; Manufacturing processes; Optical beams; Throughput;
fLanguage
English
Publisher
ieee
Conference_Titel
Ion Implantation Technology. Proceedings of the 11th International Conference on
Conference_Location
Austin, TX
Print_ISBN
0-7803-3289-X
Type
conf
DOI
10.1109/IIT.1996.586394
Filename
586394
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