DocumentCode :
3483413
Title :
Time resolved studies of electronic transport in polymeric insulators
Author :
Abkowitz, M.
Author_Institution :
Xerox Corp., Webster, NY, USA
fYear :
1989
fDate :
3-6 Jul 1989
Firstpage :
1
Lastpage :
9
Abstract :
Transport in a wide variety of glassy polymeric insulators has been found to be characterized by a convoluted yet familiar pattern of electric field and temperature dependence below Tg, the glass transition temperature, and by a relatively abrupt change in temperature dependence near Tg. Though diverse, all of these glassy dielectrics share the feature that electronic transport is mediated by field-assisted thermally stimulated emission from localized states, a process which remains incompletely understood. By proper `molecular engineering´ it has become possible to design dielectric polymers which exhibit efficient and completely trap-free transport, a requisite feature for practical applications to electrophotography. The importance of the mechanistic understanding derived from analysis of time-resolved injection in the historical development of viable organic-polymer-based photoconductors is discussed. Three materials systems are described: (1) poly(N-vinylcarbazole), PVK; (2) molecularly doped polymers; and (3) polysilanes and polygermanes
Keywords :
carrier mobility; organic insulating materials; photoconducting materials; photoconductivity; polymers; Arrhenius plot; PVK; dielectric polymers; electronic transport; electrophotography; field-assisted thermally stimulated emission; glass transition temperature; glassy polymeric insulators; hole drift mobility; localized states; molecular engineering; molecularly doped polymers; photoconductors; poly(N-vinylcarbazole); polygermanes; polysilanes; temperature dependence; time-resolved injection; Design engineering; Dielectrics and electrical insulation; Electron traps; Electrophotography; Glass; Photoconductivity; Plastic insulation; Polymers; Stimulated emission; Temperature dependence;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Conduction and Breakdown in Solid Dielectrics, 1989., Proceedings of the 3rd International Conference on
Conference_Location :
Trondheim
Type :
conf
DOI :
10.1109/ICSD.1989.69151
Filename :
69151
Link To Document :
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