Optical characterization of surface oxide in Ge-Sb-Te alloy films

Author

Sang Youl Kim ; Sang June Kim ; Tae Hee Jeong ; Jeong Woo Park ; Cheong Yeon ; Hun Seo

Author_Institution

Dept. of Phys., Ajou Univ., Suwon, South Korea

Volume

2

fYear

1999

fDate

Aug. 30 1999-Sept. 3 1999

Firstpage

379

Abstract

Ge-Sb-Te alloy film phase change recording layer can deteriorate the cyclability and it can be reduced with the nitrogen treatment. It is reported that the jitter characteristics over read-write cycle has been greatly improved. In the present research, the evolution of the surface oxide in Ge-Sb-Te alloys including nitrogen doped ones is investigated. The variation of the observed reflectivity spectra is compared with the calculated one.

Keywords

antimony alloys; germanium alloys; optical films; optical storage; solid-state phase transformations; Ge-Sb-Te alloy films; Ge-Sb-Te:N alloy film phase change recording layer; GeSbTe:N; cyclability; jitter characteristics; nitrogen treatment; optical characterization; optical storage; read-write cycle; reflectivity spectra; surface oxide; Amorphous materials; Crystallization; Nitrogen; Optical films; Optical recording; Optical refraction; Optical variables control; Reflectivity; Refractive index; Surface contamination;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics, 1999. CLEO/Pacific Rim '99. The Pacific Rim Conference on

Conference_Location

Seoul, South Korea

Print_ISBN

0-7803-5661-6

Type

conf

DOI

10.1109/CLEOPR.1999.811479

Filename

811479