DocumentCode
3483828
Title
Energy recovery circuit for testing high average power
Author
Hithcock, R.N.
Author_Institution
Phys. Int. Co., San Leandro, CA
fYear
1988
fDate
20-22 Jun 1988
Firstpage
152
Lastpage
155
Abstract
In high-average-power, high-repetition modulator systems, component testing requires a suitable testbed to perform validation and lifetime tests. The author describes a circuit for testing high-average-power components. Design information is given to show how to build a testbed that will operate at an overall power gain, defined as the power the switches operate at divided by the input power, of 10 to 20. Circuit losses are analyzed. The advantages and disadvantages of this type of circuit are discussed
Keywords
life testing; modulators; switches; circuit losses; component testing; energy recovery circuit; high average power; high-repetition modulator systems; lifetime tests; testbed; testing; validation tests; Capacitors; Circuit testing; Cooling; Life testing; Magnetic modulators; Physics; Switches; Switching circuits; System testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Modulator Symposium, 1988. IEEE Conference Record of the 1988 Eighteenth
Conference_Location
Hilton Head, SC
Type
conf
DOI
10.1109/MODSYM.1988.26257
Filename
26257
Link To Document