• DocumentCode
    3483836
  • Title

    The base resistance controlled thyristor (BRT)-a new MOS gated power thyristor

  • Author

    Nandakumar, M. ; Baliga, B.J. ; Shekar, M.S. ; Tandon, S. ; Reisman, A.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA
  • fYear
    1991
  • fDate
    22-24 Apr 1991
  • Firstpage
    138
  • Lastpage
    141
  • Abstract
    A novel MOS gated thyristor structure called the base resistance controlled thyristor is proposed. In this device structure, turn off of a thyristor built with a N drift region is achieved by diverting hole current from its p-base to an adjacent p+ region through a p-channel MOSFET. This has the effect of reducing the p-base resistance and raising the holding current of the thyristor above the operating current level. The device concept has been verified by two-dimensional numerical simulations. Experimental results on 600 V devices fabricated with an IGBT process corroborate theoretical predictions
  • Keywords
    equivalent circuits; semiconductor device models; thyristors; 600 V; IGBT process; MOS gated power thyristor; base resistance controlled thyristor; holding current; p-base resistance; p-channel MOSFET; two-dimensional numerical simulations; Anodes; Cathodes; Electric resistance; Equivalent circuits; Insulated gate bipolar transistors; MOSFET circuits; Microelectronics; Numerical simulation; Thyristors; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs, 1991. ISPSD '91., Proceedings of the 3rd International Symposium on
  • Conference_Location
    Baltimore, MD
  • ISSN
    1063-6854
  • Print_ISBN
    0-7803-0009-2
  • Type

    conf

  • DOI
    10.1109/ISPSD.1991.146084
  • Filename
    146084