DocumentCode :
3484054
Title :
Progress in ultrafast scanning probe microscopy
Author :
Weiss, S. ; Botkin, D. ; Ogletree, D.F. ; Salmeron, M. ; Chemla, D.S.
Author_Institution :
Div. of Mater. & Chem. Sci., California Univ., Berkeley, CA, USA
Volume :
2
fYear :
1994
fDate :
31 Oct-3 Nov 1994
Firstpage :
207
Abstract :
Recently, we proposed a general technique to wed ultrafast laser spectroscopy and Scanning Probe Microscopies (SPM) to obtain simultaneous picosecond time and atomic space resolution. In the experiment, a short laser pulse activated a photoconductive switch on a SOS transmission line, in order to generate short voltage pulses. While the tip was in tunneling range from one of the conductors of the transmission line, a second laser pulse gated the Scanning Tunneling Microscope (STM) tip assembly. Thus, we could excite the tunneling gap of the STM with a short voltage pulse, and measure its response. To better understand these measurements, we now model the experiment by an equivalent circuit
Keywords :
high-speed optical techniques; SOS transmission line; equivalent circuit; laser pulse; photoconductive switch; ultrafast scanning probe microscopy; voltage pulse; Atom lasers; Atomic beams; Optical pulse generation; Pulse measurements; Scanning probe microscopy; Spectroscopy; Switches; Transmission line measurements; Tunneling; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1994. LEOS '94 Conference Proceedings. IEEE
Conference_Location :
Boston, MA
Print_ISBN :
0-7803-1470-0
Type :
conf
DOI :
10.1109/LEOS.1994.586435
Filename :
586435
Link To Document :
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