Title :
Development of Accelerated Life Test
Author :
Sijun, Zhao ; Shaoping, Wang ; Jian, Shi ; Lan, Li
Author_Institution :
Sch. of Autom. Sci. & Electr. Eng., Beijing Univ. of Aeronaut. & Astronaut., Beijing
Abstract :
This paper summarizes the development of accelerated life test types, model, statistical method and its progress. To the mechatronic component whose failure mechanism is related to various operational stresses, the best way is to exploit variable stress accelerated life test (ALT), obtain the likelihood function with failure accumulative method, and then calculate the normal life on the basis of the parameter evaluation. Directing to the parameter evaluation difficulties of multiple parameters, the optimization method is widely used based on genetic algorithm.
Keywords :
failure analysis; genetic algorithms; life testing; mechatronics; statistical analysis; accelerated life test; failure accumulative method; failure mechanism; genetic algorithm; likelihood function; mechatronic component; optimization method; statistical method; Automatic testing; Consumer electronics; Costs; Electronic equipment testing; Life estimation; Life testing; Optimization methods; Statistical analysis; Statistics; Stress; accelerated life test; accelerated model; accelerated stresses; statistical method;
Conference_Titel :
Robotics, Automation and Mechatronics, 2008 IEEE Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-1675-2
Electronic_ISBN :
978-1-4244-1676-9
DOI :
10.1109/RAMECH.2008.4681467