• DocumentCode
    3485024
  • Title

    Impact of Layout, Interconnects and Variability on CMOS Technology Roadmap

  • Author

    Boeuf, Frederic ; Sellier, Manuel ; Farcy, Alexis ; Skotnicki, Thomas

  • Author_Institution
    STMicroelectronics, Crolles
  • fYear
    2007
  • fDate
    12-14 June 2007
  • Firstpage
    24
  • Lastpage
    25
  • Abstract
    In this paper, using the new generation of MASTAR software we discuss the CMOS logic roadmap in terms of circuit performance, power dissipation and variability, such as loaded ring-oscillator delay as well as through 6T-SRAM functionality. It is shown that these criteria will have to be taken into account in addition to the traditional 17%/year delay improvement to construct a new industrially viable roadmap.
  • Keywords
    CMOS integrated circuits; electronic engineering computing; 6T-SRAM functionality; CMOS technology roadmap; MASTAR software; circuit performance; loaded ring-oscillator delay; power dissipation; variability; CMOS logic circuits; CMOS technology; Capacitance; Circuit testing; Delay; Fluctuations; Integrated circuit interconnections; Logic devices; Logic testing; Power generation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, 2007 IEEE Symposium on
  • Conference_Location
    Kyoto
  • Print_ISBN
    978-4-900784-03-1
  • Type

    conf

  • DOI
    10.1109/VLSIT.2007.4339712
  • Filename
    4339712