DocumentCode :
3485516
Title :
Limiting and transient performances of a low loss PIN-Schottky limiter
Author :
Chin-Leong Lim
Author_Institution :
Avago Technol., Bayan Lepas, Malaysia
fYear :
2013
fDate :
9-11 Dec. 2013
Firstpage :
6
Lastpage :
10
Abstract :
The main cause of loss in the PIN-Schottky limiter is the diodes´ parasitic capacitances. Techniques to counter the parasitic capacitances include using bare chip, air cavity packaging, diode stacking, mesa construction, isolating the Schottky diode from the signal path and connecting the diodes to a low impedance node. But the aforementioned techniques either sacrifice cost, manufacturability, size, performances or thermal ruggedness. To reduce loss in the PIN-Schottky limiter, we re-configured its parasitics into a low pass ladder network. This paper reports on the new configuration´s changed large signal and transient performances. We observed improved isolation at 0.9 and 2.4 GHz, and a beneficial reduction in the initial energy that slips through the limiter before limiting begins. In conclusion, this configuration simultaneously improves insertion loss, matching, isolation and spike leakage suppression. It has the potential to improve limiting performances in wideband receivers for wireless communication and medical imaging.
Keywords :
Schottky diodes; limiters; p-i-n diodes; Schottky diode; air cavity packaging; chip; diode stacking; frequency 0.9 GHz; frequency 2.4 GHz; insertion loss; limiting performances; low impedance node; low loss PIN-Schottky limiter; low pass ladder network; manufacturability; medical imaging; mesa construction; parasitic capacitances; sacrifice cost; signal path; spike leakage suppression; thermal ruggedness; transient performances; wideband receivers; wireless communication; Capacitance; Insertion loss; Limiting; Microwave communication; Microwave imaging; Radio frequency; Schottky diodes; Limiter; Schottky assisted PIN limiter; Schottky enhanced PIN limiter; quasi-active limiter; receiver protection;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
RF and Microwave Conference (RFM), 2013 IEEE International
Conference_Location :
Penang
Print_ISBN :
978-1-4799-2213-0
Type :
conf
DOI :
10.1109/RFM.2013.6757206
Filename :
6757206
Link To Document :
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