DocumentCode :
3485667
Title :
The BIPM compact Josephson voltage standard
Author :
Solve, S. ; Chayramy, R.
Author_Institution :
Bur. Int. des poids et mesures (BIPM), Sevres, France
fYear :
2010
fDate :
13-18 June 2010
Firstpage :
155
Lastpage :
156
Abstract :
The BIPM has developed a new Josephson Voltage Standard (JVS) that will replace the present transportable standard in the near future. The old system has been involved in 17 international comparisons at the level of 10 V in the framework of the BIPM direct on-site JVS key comparison since 1994. The heart of the new primary standard will still consist of arrays of SIS junctions. It will be able to use future 10 V programmable arrays with minor modifications. We present here the technical details of the key parts of the compact primary JVS. The preliminary results of a direct comparison against the current BIPM 10 V primary reference have shown an agreement within a total combined relative uncertainty of 1×10-10 (k = 1).
Keywords :
measurement standards; programmable logic arrays; voltage measurement; BIPM; JVS; Josephson voltage standard; SIS junctions; programmable arrays; relative uncertainly; voltage 10 V; Aluminum; Electromagnetic waveguides; Filters; MMICs; Magnetic separation; Measurement standards; Radio frequency; Standards development; Voltage; Waveguide components;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2010 Conference on
Conference_Location :
Daejeon
Print_ISBN :
978-1-4244-6795-2
Type :
conf
DOI :
10.1109/CPEM.2010.5544756
Filename :
5544756
Link To Document :
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