• DocumentCode
    3485729
  • Title

    Neural network control of scanning probe microscope precision stage

  • Author

    Wei, Qiang ; Hu, Chengzhong ; Zhang, Dong ; Li, Xianming

  • fYear
    2009
  • fDate
    5-7 Aug. 2009
  • Firstpage
    326
  • Lastpage
    330
  • Abstract
    A new control scheme based on neural network and traditional PID controller is proposed to improve the performance of precision stage in SPMs. The mathematical model is set up by analyzing the principle of the piezoelectric actuator. Mechanical parameters are identified online by a neural estimator. The traditional PID controller is replaced by a neural network PID controller. Weights in the network and parameters of the PID controller are adjusted by the function of self learning and adaptability. The performance of real control system is enhanced. The results of experiment show that the response time is reduced from 0.38 s to 0.18 s, and the steady state error is shorten from 4.2% to 1.9% under a displacement of 10 mum.
  • Keywords
    nanofabrication; neurocontrollers; piezoelectric actuators; scanning probe microscopy; three-term control; PID controller; SPM precision stage; neural network control; piezoelectric actuator principle; scanning probe microscope; Ceramics; Control systems; Electron beams; Hysteresis; Microscopy; Neural networks; Piezoelectric actuators; Probes; Three-term control; Voltage; Neural Network; PID; Piezoelectric ceramics; Precision stage; Scanning Probe Microscope;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Automation and Logistics, 2009. ICAL '09. IEEE International Conference on
  • Conference_Location
    Shenyang
  • Print_ISBN
    978-1-4244-4794-7
  • Electronic_ISBN
    978-1-4244-4795-4
  • Type

    conf

  • DOI
    10.1109/ICAL.2009.5262903
  • Filename
    5262903