DocumentCode :
3485729
Title :
Neural network control of scanning probe microscope precision stage
Author :
Wei, Qiang ; Hu, Chengzhong ; Zhang, Dong ; Li, Xianming
fYear :
2009
fDate :
5-7 Aug. 2009
Firstpage :
326
Lastpage :
330
Abstract :
A new control scheme based on neural network and traditional PID controller is proposed to improve the performance of precision stage in SPMs. The mathematical model is set up by analyzing the principle of the piezoelectric actuator. Mechanical parameters are identified online by a neural estimator. The traditional PID controller is replaced by a neural network PID controller. Weights in the network and parameters of the PID controller are adjusted by the function of self learning and adaptability. The performance of real control system is enhanced. The results of experiment show that the response time is reduced from 0.38 s to 0.18 s, and the steady state error is shorten from 4.2% to 1.9% under a displacement of 10 mum.
Keywords :
nanofabrication; neurocontrollers; piezoelectric actuators; scanning probe microscopy; three-term control; PID controller; SPM precision stage; neural network control; piezoelectric actuator principle; scanning probe microscope; Ceramics; Control systems; Electron beams; Hysteresis; Microscopy; Neural networks; Piezoelectric actuators; Probes; Three-term control; Voltage; Neural Network; PID; Piezoelectric ceramics; Precision stage; Scanning Probe Microscope;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Automation and Logistics, 2009. ICAL '09. IEEE International Conference on
Conference_Location :
Shenyang
Print_ISBN :
978-1-4244-4794-7
Electronic_ISBN :
978-1-4244-4795-4
Type :
conf
DOI :
10.1109/ICAL.2009.5262903
Filename :
5262903
Link To Document :
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