DocumentCode
3485729
Title
Neural network control of scanning probe microscope precision stage
Author
Wei, Qiang ; Hu, Chengzhong ; Zhang, Dong ; Li, Xianming
fYear
2009
fDate
5-7 Aug. 2009
Firstpage
326
Lastpage
330
Abstract
A new control scheme based on neural network and traditional PID controller is proposed to improve the performance of precision stage in SPMs. The mathematical model is set up by analyzing the principle of the piezoelectric actuator. Mechanical parameters are identified online by a neural estimator. The traditional PID controller is replaced by a neural network PID controller. Weights in the network and parameters of the PID controller are adjusted by the function of self learning and adaptability. The performance of real control system is enhanced. The results of experiment show that the response time is reduced from 0.38 s to 0.18 s, and the steady state error is shorten from 4.2% to 1.9% under a displacement of 10 mum.
Keywords
nanofabrication; neurocontrollers; piezoelectric actuators; scanning probe microscopy; three-term control; PID controller; SPM precision stage; neural network control; piezoelectric actuator principle; scanning probe microscope; Ceramics; Control systems; Electron beams; Hysteresis; Microscopy; Neural networks; Piezoelectric actuators; Probes; Three-term control; Voltage; Neural Network; PID; Piezoelectric ceramics; Precision stage; Scanning Probe Microscope;
fLanguage
English
Publisher
ieee
Conference_Titel
Automation and Logistics, 2009. ICAL '09. IEEE International Conference on
Conference_Location
Shenyang
Print_ISBN
978-1-4244-4794-7
Electronic_ISBN
978-1-4244-4795-4
Type
conf
DOI
10.1109/ICAL.2009.5262903
Filename
5262903
Link To Document