Ferromagnetic resonance investigations of ion beam modified Fe- and FeNi-films

Author

Kurowski, D. ; Meckenstock, R. ; Pelzl, J. ; Brand, K. ; Schafer, Markus ; Grunberg, P.

Author_Institution

AG Festkorperspektroskopie, Ruhr-Univ., Bochum, Germany

fYear

1996

fDate

16-21 Jun 1996

Firstpage

725

Lastpage

728

Abstract

Ion beam induced modifications of the magnetic properties of thin ferromagnetic films were investigated with the sensitive ferromagnetic resonance. The effects of compositional changes were studied by high dose Ni-implantations into polycrystalline Fe₂₀Ni₈₀-alloy-films, which lead mainly to a reduction of the magnetization due to Ni-enrichment. On the other hand the influences of radiation damages and ion beam mixing were investigated by Fe-irradiations in epitaxial Ag/Fe/Ag-layers. The irradiations result in a decrease of the uniaxial-perpendicular- and of the magnetocrystalline-anisotropy constant, which is attributed to strain relaxation. At high fluences of 10¹⁶ cm^-2 we observed a change of the magnetocrystalline anisotropy from cubic towards a tetragonal symmetry

Keywords

ferromagnetic materials; ferromagnetic resonance; ion beam mixing; ion implantation; iron; iron alloys; magnetic anisotropy; magnetic epitaxial layers; magnetic thin films; magnetisation; nickel alloys; perpendicular magnetic anisotropy; Ag-Fe-Ag; Fe ion irradiation; Fe₂₀Ni₈₀; Ni ion implantation; composition; epitaxial Ag/Fe/Ag layer; ferromagnetic film; ferromagnetic resonance; ion beam mixing; magnetic properties; magnetization; magnetocrystalline anisotropy; polycrystalline Fe₂₀Ni₈₀ alloy; radiation damage; strain relaxation; uniaxial perpendicular anisotropy; Ion beams; Iron; Magnetic anisotropy; Magnetic field induced strain; Magnetic films; Magnetic properties; Magnetic resonance; Magnetization; Perpendicular magnetic anisotropy; Uniaxial strain;

fLanguage

English

Publisher

ieee

Conference_Titel

Ion Implantation Technology. Proceedings of the 11th International Conference on

Conference_Location

Austin, TX

Print_ISBN

0-7803-3289-X

Type

conf

DOI

10.1109/IIT.1996.586530

Filename

586530