Title :
Image restoration through l0 analysis-based sparse optimization in tight frames
Author :
Portilla, Javier
Author_Institution :
Imaging & Vision Dept., Consejo Super. de Investig. Cientificas (CSIC), Madrid, Spain
Abstract :
Sparse optimization in overcomplete frames has been widely applied in recent years to ill-conditioned inverse problems. In particular, analysis-based sparse optimization consists of achieving a certain trade-off between fidelity to the observation and sparsity in a given linear representation, typically measured by some ¿p quasi-norm. Whereas most popular choice for p is 1 (convex optimization case), there is an increasing evidence on both the computational feasibility and higher performance potential of non-convex approaches (0 ¿ p < 1). The extreme p = 0 case is especial, because analysis coefficients of typical images obtained using typical pyramidal frames are not strictly sparse, but rather compressible. Here we model the analysis coefficients as a strictly sparse vector plus a Gaussian correction term. This statistical formulation allows for an elegant iterated marginal optimization. We also show that it provides state-of-the-art performance, in a least-squares error sense, in standard deconvolution tests.
Keywords :
Gaussian processes; image restoration; inverse problems; iterative methods; mean square error methods; optimisation; Gaussian correction; L0 analysis-based sparse optimization; convex optimization; deconvolution tests; image restoration; inverse problems; iterated marginal optimization; least-squares error; linear representation; overcomplete frames; tight frames; Deconvolution; High performance computing; Image analysis; Image coding; Image restoration; Inverse problems; Optical imaging; Optical sensors; Particle measurements; Testing; Image deconvolution; image restoration; optimization; regularization; sparsity; tight frames; wavelets;
Conference_Titel :
Image Processing (ICIP), 2009 16th IEEE International Conference on
Conference_Location :
Cairo
Print_ISBN :
978-1-4244-5653-6
Electronic_ISBN :
1522-4880
DOI :
10.1109/ICIP.2009.5413975