DocumentCode
3486101
Title
Floating Body DRAM Characteristics of Silicon-On-ONO (SOONO) Devices for System-on-Chip (SoC) Applications
Author
Oh, Chang Woo ; Kim, Na Young ; Song, Ho Ju ; Hong, Sung In ; Kim, Sung Hwan ; Choi, Yong Lack ; Bae, Hyun Jun ; Choi, Dong Uk ; Lee, Yong Seok ; Kim, Dong-Won ; Park, Donggun ; Ryu, Byung-Il
Author_Institution
Samsung Electron. Co., Yongin
fYear
2007
fDate
12-14 June 2007
Firstpage
168
Lastpage
169
Abstract
We completed the demonstration of three key functions of SOONO devices by demonstrating the DRAM characteristics of FD and PD SOONO devices successfully, together with the previously reported logic transistor and flash memory characteristics. Floating body SOONO DRAM cells implemented on electrically thin buried insulator shows the large sensing margins more than 5muA in FD device with long data retention and nondestructive read even at the W/L of 60/55nm which is the smallest IT DRAM ever reported.
Keywords
DRAM chips; Si; electrically thin buried insulator; flash memory characteristics; floating body DRAM characteristics; silicon-On-ONO devices; system-on-chip applications; Costs; Dielectrics and electrical insulation; Impact ionization; Logic devices; Random access memory; Research and development; Scalability; Silicon on insulator technology; System-on-a-chip; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Technology, 2007 IEEE Symposium on
Conference_Location
Kyoto
Print_ISBN
978-4-900784-03-1
Type
conf
DOI
10.1109/VLSIT.2007.4339769
Filename
4339769
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