Title :
[Copyright notice]
Abstract :
The following topics are dealt with: logic-and-high-level synthesis; test power temperature control; system-level thermal and power management; circuit optimization and modeling; system-level simulation; analog and memory IC design; graphene electronics; CAD design; DFM methods for advanced lithography; system-level optimization in highly parallel architectures; thermal analysis and optimization; path delay anomaly identification; and oscillator macromodeling.
Keywords :
analogue integrated circuits; circuit CAD; circuit optimisation; design for manufacture; high level synthesis; integrated circuit design; integrated circuit modelling; integrated logic circuits; integrated memory circuits; lithography; logic design; oscillators; temperature control; thermal analysis; thermal management (packaging); CAD design; DFM methods; advanced lithography; analog-and-memory IC design; circuit modelling; circuit optimization; design-for-manufacturability; graphene electronics; logic-and-high-level synthesis; oscillator macromodeling; path delay anomaly identification; system-level optimization; system-level power management; system-level simulation; system-level thermal management; test power temperature control; thermal analysis;
Conference_Titel :
Computer-Aided Design, 2008. ICCAD 2008. IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-2819-9
DOI :
10.1109/ICCAD.2008.4681543
