Title :
Josephson-based test bench for ac characterization of analog-to-digital converters
Author :
Overney, F. ; Rüfenacht, A. ; Braun, J.P. ; Jeanneret, B.
Author_Institution :
Fed. Office of Metrol. METAS, Bern-Wabern, Switzerland
Abstract :
To perform systematic characterization of high resolution analog-to-digital converters (ADC), a test bench based on a 1 V programmable Josephson voltage standard (PJVS) has been developed. The PJVS generates different waveforms used as references which are sampled by the digitizer under test. As a first and preliminary example, the integral nonlinearity of a commercial 24-bits delta-sigma converter has been measured. It was found to be smaller than 4 μV/V at a frequency of 16 Hz on its 1 V range.
Keywords :
Josephson effect; measurement standards; sigma-delta modulation; voltage measurement; AC characterization; Josephson-based test bench; PJVS; delta-sigma converter; digitizer under test; frequency 16 Hz; high resolution analog-to-digital converters; programmable Josephson voltage standard; voltage 1 V; word length 24 bit; Analog-digital conversion; Clocks; Electromagnetic measurements; Frequency; Metrology; Performance evaluation; Sampling methods; Standards development; System testing; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2010 Conference on
Conference_Location :
Daejeon
Print_ISBN :
978-1-4244-6795-2
DOI :
10.1109/CPEM.2010.5544779