• DocumentCode
    3486327
  • Title

    Modeling the near-gap dielectric properties of strained-layer multiple quantum wells and superlattices

  • Author

    Trivedi, Dhrupad ; Anderson, Neal G.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
  • Volume
    2
  • fYear
    1994
  • fDate
    31 Oct-3 Nov 1994
  • Firstpage
    291
  • Abstract
    We have developed a comprehensive approach to the calculation of the full complex permittivity tensor of an arbitrary direct-gap strained-layer superlattice (SLS) at frequencies near the fundamental band gap. The model utilizes a combination of strain-dependent superlattice K.p and nearest-neighbor tight-binding supercell models of SLS electronic structure, which is designed to provide band structures throughout the full SLS Brillouin zone which are highly accurate near the band edges. In this work, we will provide a detailed description of our approach and results of sample calculations illustrating the effects of tensile and compressive layer strains on the polarization dependence of SLS refractive index
  • Keywords
    semiconductor quantum wells; K.p modelling; SLS electronic structure; SLS refractive index; arbitrary direct-gap strained-layer superlattice; band structures; compressive layer strains; full SLS Brillouin zone; full complex permittivity tensor; fundamental band gap; near-gap dielectric properties; nearest-neighbor tight-binding supercell models; polarization dependence; strain-dependent superlattice; strained-layer multiple quantum wells; strained-layer superlattices; tensile strains; Dielectrics; Frequency; Laser sintering; Permittivity; Photonic band gap; Polarization; Refractive index; Superlattices; Tensile strain; Tensile stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Society Annual Meeting, 1994. LEOS '94 Conference Proceedings. IEEE
  • Conference_Location
    Boston, MA
  • Print_ISBN
    0-7803-1470-0
  • Type

    conf

  • DOI
    10.1109/LEOS.1994.586555
  • Filename
    586555