DocumentCode :
3486344
Title :
Design of RF integrated circuits using SiGe bipolar technology
Author :
Götzfried, Rainer ; Beisswanger, Frank ; Gerlach, Stephan
Author_Institution :
TEMIC Telefunken Microelectron., Hellbronn, Germany
fYear :
1997
fDate :
28-30 Sep 1997
Firstpage :
51
Lastpage :
56
Abstract :
We report on design aspects and the implementation of RF ICs using TEMIC´s SiGe heterojunction bipolar technology. The differences between the device parameters of Si-BJT and SiGe-HBT technology and their influence on IC design are discussed. Design and measurement results of RF ICs, including low-noise-amplifier, power-amplifier and SPDT antenna switch for application in a 1.9 GHz DECT RF front-end are presented
Keywords :
Ge-Si alloys; UHF integrated circuits; UHF power amplifiers; bipolar analogue integrated circuits; cordless telephone systems; heterojunction bipolar transistors; integrated circuit design; semiconductor materials; 1.9 GHz; DECT RF front-end; HBT technology; IC design; RF integrated circuits; SiGe; TEMIC; antenna switch; bipolar technology; device parameters; low-noise-amplifier; power-amplifier; Antenna measurements; Bipolar integrated circuits; Germanium silicon alloys; Heterojunctions; Integrated circuit measurements; Integrated circuit technology; Radio frequency; Radiofrequency integrated circuits; Silicon germanium; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology Meeting, 1997. Proceedings of the
Conference_Location :
Minneapolis, MN
ISSN :
1088-9299
Print_ISBN :
0-7803-3916-9
Type :
conf
DOI :
10.1109/BIPOL.1997.647354
Filename :
647354
Link To Document :
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