DocumentCode :
3486444
Title :
Calibrating E-field probes with a tapered cell
Author :
Shay, W.T. ; Hong, W.P. ; Lao, R.R.
fYear :
2010
fDate :
13-18 June 2010
Firstpage :
553
Lastpage :
554
Abstract :
Tapered cells can be used in E-filed probes calibration. Nevertheless, few research documents on tapered cells are found presently. In our lab, we configured an E-field probe calibration system with a tapered cell. By using a reference probe as standard, we can determine the correction factors of E-field probes for frequency range from 200 MHz to 2.5 GHz. This paper describes the structure and characteristics of the tapered cell. The way to use it for probes calibration is also introduced.
Keywords :
TEM cells; calibration; probes; e-filed probes calibration; tapered cells; Anechoic chambers; Antenna measurements; Calibration; Communication industry; Electromagnetic measurements; Measurement standards; Probes; Radio frequency; TEM cells; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2010 Conference on
Conference_Location :
Daejeon
Print_ISBN :
978-1-4244-6795-2
Type :
conf
DOI :
10.1109/CPEM.2010.5544796
Filename :
5544796
Link To Document :
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