DocumentCode
3486609
Title
Next generation guarded Hamon transfer standards for high resistance
Author
Jarrett, D.G. ; Dupree, A.J.
Author_Institution
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fYear
2010
fDate
13-18 June 2010
Firstpage
571
Lastpage
572
Abstract
Guarded Hamon transfer standards have been used at NIST for decades for scaling to high resistance levels. A recent project has been undertaken to apply improved designs in guarded Hamon transfer standards to the 1 MΩ to 100 MΩ ranges with the larger goal of applying these experimental guarding and construction techniques to guarded Hamon transfer standards in the 100 GΩ to 100 TΩ ranges in the future. A guarded backbone structure, elimination of charge-storing materials in the connections, and the hermetic sealing of all the elements in one canister are the key features of this new design of transfer standards.
Keywords
comparators (circuits); cryogenic electronics; electric resistance; hermetic seals; resistors; HR-CCC; NIST; charge-storing material eliminatoin; cryogenic current comparators; guarded backbone structure; hermetic sealing; high resistance levels; next generation guarded Hamon transfer standard; quantized Hall resistance standard; resistance 1 Mohm to 100 Mohm; resistance 100 Gohm to 100 Gohm; Circuits; Educational institutions; Fixtures; Insulation; Leakage current; Measurement standards; NIST; Resistors; Seals; Standards development;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements (CPEM), 2010 Conference on
Conference_Location
Daejeon
Print_ISBN
978-1-4244-6795-2
Type
conf
DOI
10.1109/CPEM.2010.5544805
Filename
5544805
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