• DocumentCode
    3486609
  • Title

    Next generation guarded Hamon transfer standards for high resistance

  • Author

    Jarrett, D.G. ; Dupree, A.J.

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    571
  • Lastpage
    572
  • Abstract
    Guarded Hamon transfer standards have been used at NIST for decades for scaling to high resistance levels. A recent project has been undertaken to apply improved designs in guarded Hamon transfer standards to the 1 MΩ to 100 MΩ ranges with the larger goal of applying these experimental guarding and construction techniques to guarded Hamon transfer standards in the 100 GΩ to 100 TΩ ranges in the future. A guarded backbone structure, elimination of charge-storing materials in the connections, and the hermetic sealing of all the elements in one canister are the key features of this new design of transfer standards.
  • Keywords
    comparators (circuits); cryogenic electronics; electric resistance; hermetic seals; resistors; HR-CCC; NIST; charge-storing material eliminatoin; cryogenic current comparators; guarded backbone structure; hermetic sealing; high resistance levels; next generation guarded Hamon transfer standard; quantized Hall resistance standard; resistance 1 Mohm to 100 Mohm; resistance 100 Gohm to 100 Gohm; Circuits; Educational institutions; Fixtures; Insulation; Leakage current; Measurement standards; NIST; Resistors; Seals; Standards development;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements (CPEM), 2010 Conference on
  • Conference_Location
    Daejeon
  • Print_ISBN
    978-1-4244-6795-2
  • Type

    conf

  • DOI
    10.1109/CPEM.2010.5544805
  • Filename
    5544805