DocumentCode :
3486609
Title :
Next generation guarded Hamon transfer standards for high resistance
Author :
Jarrett, D.G. ; Dupree, A.J.
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fYear :
2010
fDate :
13-18 June 2010
Firstpage :
571
Lastpage :
572
Abstract :
Guarded Hamon transfer standards have been used at NIST for decades for scaling to high resistance levels. A recent project has been undertaken to apply improved designs in guarded Hamon transfer standards to the 1 MΩ to 100 MΩ ranges with the larger goal of applying these experimental guarding and construction techniques to guarded Hamon transfer standards in the 100 GΩ to 100 TΩ ranges in the future. A guarded backbone structure, elimination of charge-storing materials in the connections, and the hermetic sealing of all the elements in one canister are the key features of this new design of transfer standards.
Keywords :
comparators (circuits); cryogenic electronics; electric resistance; hermetic seals; resistors; HR-CCC; NIST; charge-storing material eliminatoin; cryogenic current comparators; guarded backbone structure; hermetic sealing; high resistance levels; next generation guarded Hamon transfer standard; quantized Hall resistance standard; resistance 1 Mohm to 100 Mohm; resistance 100 Gohm to 100 Gohm; Circuits; Educational institutions; Fixtures; Insulation; Leakage current; Measurement standards; NIST; Resistors; Seals; Standards development;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2010 Conference on
Conference_Location :
Daejeon
Print_ISBN :
978-1-4244-6795-2
Type :
conf
DOI :
10.1109/CPEM.2010.5544805
Filename :
5544805
Link To Document :
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