• DocumentCode
    3486715
  • Title

    Pulse width allocation with clock skew scheduling for optimizing pulsed latch-based sequential circuits

  • Author

    Lee, Hyein ; Paik, Seungwhun ; Shin, Youngsoo

  • Author_Institution
    Dept. of Electr. Eng., KAIST, Daejeon
  • fYear
    2008
  • fDate
    10-13 Nov. 2008
  • Firstpage
    224
  • Lastpage
    229
  • Abstract
    Pulsed latches, latches driven by a brief clock pulse, offer the convenience of flip-flop-like timing verification and optimization, while retaining superior design parameters of latches over flip-flops. But, pulsed latch-based design using a single pulse width has a limitation in reducing clock period. The limitation still exists even if clock skew scheduling is employed, since the amount of skew that can be assigned is practically limited due to process variations. The problem of allocating pulse width (out of discrete number of predefined widths) and scheduling clock skew (within prescribed upper bound) is formulated, for the first time, for optimizing pulsed latch-based sequential circuits. An allocation algorithm called PWCS_Optimize is proposed to solve the problem. Experiments with 65-nm technology demonstrate that small number of variety of pulse widths (up to 5) combined with clock skews (up to 10% of clock period) yield minimum clock period for many benchmark circuits. The design flow including PWCS_Optimize, placement and routing, and synthesis of local and global clock trees is presented and assessed with example circuits.
  • Keywords
    benchmark testing; clocks; flip-flops; sequential circuits; allocation algorithm; benchmark circuits; clock skew scheduling; design flow; flip-flops; global clock trees; local clock trees; pulse width allocation; pulsed latches; routing; sequential circuits; Clocks; Design optimization; Flip-flops; Latches; Pulse circuits; Routing; Sequential circuits; Space vector pulse width modulation; Timing; Upper bound;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design, 2008. ICCAD 2008. IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA
  • ISSN
    1092-3152
  • Print_ISBN
    978-1-4244-2819-9
  • Electronic_ISBN
    1092-3152
  • Type

    conf

  • DOI
    10.1109/ICCAD.2008.4681578
  • Filename
    4681578