DocumentCode :
3486823
Title :
Precise millimeter-wave dielectric measurements of single crystal ferroelectric materials
Author :
Afsar, Mohammed N. ; Korolev, Konstantin A. ; Li, Zijing
Author_Institution :
Dept. of Electr. & Comput. Eng., Tufts Univ., Medford, MA, USA
fYear :
2010
fDate :
13-18 June 2010
Firstpage :
583
Lastpage :
584
Abstract :
Transmittance measurements on various single crystal ferroelectric materials over a broad millimeter-wave frequency range have been performed. The frequency dependence of the complex dielectric permittivity has been determined in the millimeter wave region for the first time. The measurements have been employed using a free-space quasi-optical millimeter-wave spectrometer equipped with a set of high power backward wave oscillators (BWOs) as sources of coherent radiation, tunable in the range from 30 - 120 GHz. The uncertainties and possible sources of instrumentation and measurement errors related to the free-space millimeter-wave technique are discussed. This work has demonstrated that precise MMW permittivities can be obtained even on small thin crystals using the BWO quasi-optical approach. The real and imaginary parts of dielectric permittivity have been extracted from the accurate transmittance spectra. The effect of crystallographic orientation on complex permittivity, which is shown to be more than a factor of 1.5 between different orientations, has been carefully examined for Lithium Niobate.
Keywords :
backward wave oscillators; ferroelectric materials; lithium compounds; millimetre wave spectra; permittivity; LiNbO3; coherent radiation; dielectric permittivity; free-space quasioptical millimeter-wave spectrometer; high power backward wave oscillators; millimeter-wave dielectric measurement; single crystal ferroelectric materials; thin crystals; Dielectric measurements; Ferroelectric materials; Frequency dependence; Frequency measurement; Millimeter wave measurements; Millimeter wave technology; Performance evaluation; Permittivity measurement; Power measurement; Spectroscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2010 Conference on
Conference_Location :
Daejeon
Print_ISBN :
978-1-4244-6795-2
Type :
conf
DOI :
10.1109/CPEM.2010.5544817
Filename :
5544817
Link To Document :
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