• DocumentCode
    3487210
  • Title

    Automated extraction of expert knowledge in analog topology selection and sizing

  • Author

    McConaghy, Trent ; Palmers, Pieter ; Gielen, Georges ; Steyaert, Michiel

  • Author_Institution
    ESAT-MICAS, K.U. Leuven, Leuven
  • fYear
    2008
  • fDate
    10-13 Nov. 2008
  • Firstpage
    392
  • Lastpage
    395
  • Abstract
    This paper presents a methodology for analog designers to maintain their insights into the relationship among performance specifications, topology choice, and sizing variables, despite those insights being constantly challenged by changing process nodes and new specs. The methodology is to take a data-mining perspective on a Pareto Optimal Set of sized analog circuit topologies, then doing: extraction of a specs-to-topology decision tree; global nonlinear sensitivity analysis on topology and sizing variables; and determining analytical expressions of performance tradeoffs. These approaches are all complementary as they answer different designer questions. Once the knowledge is extracted, it can be readily distributed to help other designers, without needing further synthesis. Results are shown for operational amplifier design on a database containing thousands of Pareto Optimal designs across five objectives.
  • Keywords
    Pareto analysis; analogue circuits; circuit optimisation; data mining; electronic engineering computing; expert systems; network topology; operational amplifiers; Pareto optimal set; analog circuit topology; analog topology selection; analog topology sizing; datamining perspective; expert knowledge automated extraction; operational amplifier design; performance specifications; sizing variables; specs-to-topology decision tree; topology choice; Analytical models; CMOS technology; Circuit simulation; Circuit topology; Databases; Decision trees; Design automation; Operational amplifiers; Performance analysis; Space technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design, 2008. ICCAD 2008. IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA
  • ISSN
    1092-3152
  • Print_ISBN
    978-1-4244-2819-9
  • Electronic_ISBN
    1092-3152
  • Type

    conf

  • DOI
    10.1109/ICCAD.2008.4681603
  • Filename
    4681603