DocumentCode :
3487320
Title :
Secondary emission impaired by charge accumulation in dielectrics: the dynamical method
Author :
Ferreira, G.F.Leal ; de Figueiredo, M.T.
Author_Institution :
Inst. de Fisica de Sao Carlos, univ. de Sao Paulo, Sao Carlos, Brazil
fYear :
2005
fDate :
11-14 Sept. 2005
Firstpage :
200
Lastpage :
203
Abstract :
R.I.C. equations are applied in an attempt to explain secondary emission measurements obtained by continuous electron beam irradiation of a dielectric (Teflon FEP) according to the dynamic method devised by H. von Seggern.
Keywords :
dielectric materials; electron beam effects; secondary emission; RIC equations; charge accumulation; continuous electron beam irradiation; dielectrics; dynamical method; secondary emission; Charge measurement; Current measurement; Dielectric measurements; Electrodes; Electron beams; Equations; Polymers; Production; Pulse measurements; Space charge;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrets, 2005. ISE-12. 2005 12th International Symposium on
Print_ISBN :
0-7803-9116-0
Type :
conf
DOI :
10.1109/ISE.2005.1612355
Filename :
1612355
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3487320
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