DocumentCode :
3487396
Title :
Transition-aware decoupling-capacitor allocation in power noise reduction
Author :
Chen, Po-Yuan ; Liu, Che-Yu ; Hwang, TingTing
Author_Institution :
Dept. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu
fYear :
2008
fDate :
10-13 Nov. 2008
Firstpage :
426
Lastpage :
429
Abstract :
Dynamic power noises may not only degrade the circuit performance but also reduce the noise margin which may result in the functional errors in integrated circuit. Decoupling capacitor (decap) allocation is one of the most effective way in reducing serious dynamic power noises (hotspots). To allocate decap before placement, we observed that not only locations but also rising time of functional cells are required to accurately predict power noises. Compared to a previous work which only takes neighborhood relation into consideration, our method is more efficient in reducing hotspots. Furthermore, to reduce the hotspots after placement, instead of only using the empty space as proposed in the previous work, we move out cells in the area with serious power noise area (hot area). The obtained empty space can be used to accommodate decaps to further reduce the hotspots. The experimental result shows, compared to the previous work [1], our estimation function to allocate decap before placement is 23% better in reducing power noises. Moreover, compared to a method which fills decaps to all remaining empty space, our cell move algorithm can almost eliminate all the remaining hot grid nodes and hot cells. In summary, compared to the original circuits (without decap), about 60% of hotspots can be removed using our prediction function before placement, and most of the remaining hotspots are removed by our cell moving step after placement.
Keywords :
VLSI; capacitors; integrated circuit design; power supply circuits; VLSI design; estimation function; hot cells; hot grid nodes; integrated circuit; power noise reduction; prediction function; transition-aware decoupling-capacitor allocation; Capacitors; Circuit noise; Circuit optimization; Clocks; Computer science; Degradation; Dynamic voltage scaling; Integrated circuit noise; Noise reduction; Power supplies;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Design, 2008. ICCAD 2008. IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
ISSN :
1092-3152
Print_ISBN :
978-1-4244-2819-9
Electronic_ISBN :
1092-3152
Type :
conf
DOI :
10.1109/ICCAD.2008.4681610
Filename :
4681610
Link To Document :
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