DocumentCode
3487487
Title
An artificial neural model of the microstrip lines
Author
Turker, Nurhan ; Gunes, Filiz
Author_Institution
Yildiz Teknik Universitesi, Istanbul, Turkey
fYear
2004
fDate
28-30 April 2004
Firstpage
657
Lastpage
660
Abstract
The black-box model of a microstrip transmission line is worked out. The input free variables taken are the substrate thickness, H, the conductor strip width, W, and the conductor thickness, T, as the geometric dimensions of the system, as well as the normalized frequency, fH, (GHz mm), and the dielectric constants, εx, εy; the functions of characteristic impedance, Z0, and effective dielectric constant, εeff, are the results at the output of the black-box. A simple neural network with a single hidden layer is employed for the evaluation inside the black-box, which is activated by a sigmoid function and trained by the Levenberg-Marquard algorithm. Approximate analytic solutions, with empirical adjustment of their numerical constants to achieve the desired accuracy, are utilized to obtain the training and test data. Commonly used materials, such as alumina, PTFE/microfiber glass, gallium arsenide, and RT/Duroid 6006 are applied to the neural network and their Z0 and εeff are obtained as functions of H, W/H, T, fH, εx and εy. This neural network model can be used for the analysis and the synthesis of microstrip circuits, including monolithic microwave integrated circuits.
Keywords
circuit CAD; circuit analysis computing; electric impedance; learning (artificial intelligence); microstrip circuits; microstrip lines; neural nets; permittivity; substrates; transmission line theory; Levenberg-Marquard algorithm; PTFE/microfiber glass; RT/Duroid 6006; alumina; artificial neural model; black-box model; characteristic impedance; conductor strip width; conductor thickness; effective dielectric constant; gallium arsenide; hidden layer; microstrip circuit analysis; microstrip circuit synthesis; microstrip lines; microstrip transmission line; monolithic microwave integrated circuits; neural network; normalized frequency; sigmoid function; substrate thickness; Conductors; Dielectric constant; Dielectric substrates; Frequency; Integrated circuit modeling; Integrated circuit synthesis; Microstrip; Neural networks; Strips; Transmission lines;
fLanguage
English
Publisher
ieee
Conference_Titel
Signal Processing and Communications Applications Conference, 2004. Proceedings of the IEEE 12th
Print_ISBN
0-7803-8318-4
Type
conf
DOI
10.1109/SIU.2004.1338616
Filename
1338616
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