DocumentCode :
3487614
Title :
A novel wavelet domain statistical approach for denoising SAR images
Author :
Amirmazlaghani, Maryam ; Amindavar, Hamidreza
Author_Institution :
Amirkabir Univ. of Technol., Tehran, Iran
fYear :
2009
fDate :
7-10 Nov. 2009
Firstpage :
3861
Lastpage :
3864
Abstract :
In this paper, we present a novel Bayesian-based speckle suppression method for Synthetic Aperture Radar (SAR) images within the framework of wavelet analysis. We introduce two-dimensional Generalized Autoregressive Conditional Heteroscedasticity Mixture (2D-GARCH-M) model as an extension of two-dimensional GARCH (2D-GARCH) model and use it for statistical modeling of SAR images subbands. Similar to 2D-GARCH model, this new model can capture heavy tailed marginal distribution and the intrascale dependencies of wavelet coefficients. Also, 2D-GARCH-M model introduces additional flexibility in the model formulation in comparison with 2D-GARCH model, which can result in better characterization of SAR images´ subbands and improved restoration in noisy environments. Then, we design a Bayesian estimator for estimating the clean image wavelet coefficients. Finally, we compare our proposed method with various speckle suppression methods applied on actual and synthetic SAR images and verify the performance improvement in utilizing the new strategy.
Keywords :
image denoising; radar imaging; synthetic aperture radar; wavelet transforms; SAR images; autoregressive conditional heteroscedasticity mixture; image denoising; novel wavelet domain statistical approach; speckle suppression methods; synthetic aperture radar images; wavelet coefficients; Bayesian methods; Image analysis; Image restoration; Noise reduction; Speckle; Synthetic aperture radar; Wavelet analysis; Wavelet coefficients; Wavelet domain; Working environment noise; 2D-GARCH-M model; Synthetic Aperture Radar (SAR) images; speckle; statistical modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing (ICIP), 2009 16th IEEE International Conference on
Conference_Location :
Cairo
ISSN :
1522-4880
Print_ISBN :
978-1-4244-5653-6
Electronic_ISBN :
1522-4880
Type :
conf
DOI :
10.1109/ICIP.2009.5414050
Filename :
5414050
Link To Document :
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