• DocumentCode
    3487664
  • Title

    Evaluation of voltage interpolation to address process variations

  • Author

    Brownell, Kevin ; Wei, Gu-Yeon ; Brooks, David

  • Author_Institution
    Sch. of Eng. & Appl. Sci., Harvard Univ., Cambridge, MA
  • fYear
    2008
  • fDate
    10-13 Nov. 2008
  • Firstpage
    529
  • Lastpage
    536
  • Abstract
    Post-fabrication tuning provides a promising design approach to mitigate the performance and power overheads of process variation in advanced fabrication technologies. This paper explores design considerations and VLSI-CAD support for a recently proposed post-fabrication tuning knob called voltage interpolation. The paper discusses design tradeoffs between circuit tuning range and static power overheads that can be performed within the synthesis flow of the design process. The paper explores the scheme for a 64-core chip-multiprocessor machine using industrial-grade design blocks and shows that the scheme can be used to mitigate overhead arising from random and correlated within-die process variations. The analysis shows that the scheme can match the nominal delay target with a 10% power cost, or for the same power budget, incur only a 9% delay overhead after variations.
  • Keywords
    VLSI; circuit CAD; interpolation; multiprocessing systems; 64-core chip-multiprocessor machine; VLSI-CAD; industrial-grade design blocks; tuning knob; voltage interpolation; CMOS technology; Circuit optimization; Costs; Delay; Fabrication; Frequency; Interpolation; Transistors; Tuning; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design, 2008. ICCAD 2008. IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA
  • ISSN
    1092-3152
  • Print_ISBN
    978-1-4244-2819-9
  • Electronic_ISBN
    1092-3152
  • Type

    conf

  • DOI
    10.1109/ICCAD.2008.4681626
  • Filename
    4681626