DocumentCode :
3487664
Title :
Evaluation of voltage interpolation to address process variations
Author :
Brownell, Kevin ; Wei, Gu-Yeon ; Brooks, David
Author_Institution :
Sch. of Eng. & Appl. Sci., Harvard Univ., Cambridge, MA
fYear :
2008
fDate :
10-13 Nov. 2008
Firstpage :
529
Lastpage :
536
Abstract :
Post-fabrication tuning provides a promising design approach to mitigate the performance and power overheads of process variation in advanced fabrication technologies. This paper explores design considerations and VLSI-CAD support for a recently proposed post-fabrication tuning knob called voltage interpolation. The paper discusses design tradeoffs between circuit tuning range and static power overheads that can be performed within the synthesis flow of the design process. The paper explores the scheme for a 64-core chip-multiprocessor machine using industrial-grade design blocks and shows that the scheme can be used to mitigate overhead arising from random and correlated within-die process variations. The analysis shows that the scheme can match the nominal delay target with a 10% power cost, or for the same power budget, incur only a 9% delay overhead after variations.
Keywords :
VLSI; circuit CAD; interpolation; multiprocessing systems; 64-core chip-multiprocessor machine; VLSI-CAD; industrial-grade design blocks; tuning knob; voltage interpolation; CMOS technology; Circuit optimization; Costs; Delay; Fabrication; Frequency; Interpolation; Transistors; Tuning; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Design, 2008. ICCAD 2008. IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
ISSN :
1092-3152
Print_ISBN :
978-1-4244-2819-9
Electronic_ISBN :
1092-3152
Type :
conf
DOI :
10.1109/ICCAD.2008.4681626
Filename :
4681626
Link To Document :
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