DocumentCode
3487664
Title
Evaluation of voltage interpolation to address process variations
Author
Brownell, Kevin ; Wei, Gu-Yeon ; Brooks, David
Author_Institution
Sch. of Eng. & Appl. Sci., Harvard Univ., Cambridge, MA
fYear
2008
fDate
10-13 Nov. 2008
Firstpage
529
Lastpage
536
Abstract
Post-fabrication tuning provides a promising design approach to mitigate the performance and power overheads of process variation in advanced fabrication technologies. This paper explores design considerations and VLSI-CAD support for a recently proposed post-fabrication tuning knob called voltage interpolation. The paper discusses design tradeoffs between circuit tuning range and static power overheads that can be performed within the synthesis flow of the design process. The paper explores the scheme for a 64-core chip-multiprocessor machine using industrial-grade design blocks and shows that the scheme can be used to mitigate overhead arising from random and correlated within-die process variations. The analysis shows that the scheme can match the nominal delay target with a 10% power cost, or for the same power budget, incur only a 9% delay overhead after variations.
Keywords
VLSI; circuit CAD; interpolation; multiprocessing systems; 64-core chip-multiprocessor machine; VLSI-CAD; industrial-grade design blocks; tuning knob; voltage interpolation; CMOS technology; Circuit optimization; Costs; Delay; Fabrication; Frequency; Interpolation; Transistors; Tuning; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer-Aided Design, 2008. ICCAD 2008. IEEE/ACM International Conference on
Conference_Location
San Jose, CA
ISSN
1092-3152
Print_ISBN
978-1-4244-2819-9
Electronic_ISBN
1092-3152
Type
conf
DOI
10.1109/ICCAD.2008.4681626
Filename
4681626
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