مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

3487729

Title :

Silicon Sensors And Microstructures

Author :

Bryzek, Janusz

Author_Institution :

NovaSensor

fYear :

1991

fDate :

16-18 April 1991

Firstpage :

661

Lastpage :

665

Keywords :

Atomic measurements; Costs; Electrostatic measurements; Magnetic field measurement; Mechanical sensors; Microstructure; Sensor systems; Silicon; Transducers; Wavelength measurement;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Electro International, 1991

Conference_Location :

New York, NY, USA

Type :

conf

DOI :

10.1109/ELECTR.1991.718293

Filename :

718293

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3487729