• DocumentCode
    3487839
  • Title

    Spatial distribution modeling for detection of clustered microcalcifications

  • Author

    Jing, Hao ; Yang, Yongyi

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
  • fYear
    2009
  • fDate
    7-10 Nov. 2009
  • Firstpage
    657
  • Lastpage
    660
  • Abstract
    We propose a spatial point-process modeling approach to improve the detection of clustered microcalcifications (MCs) in mammogram images. Apart from the predominant approach for MC detection, in which individual MCs in an image are first detected independently and then grouped into clusters, our proposed approach aims to incorporate the spatial clustering property of the MCs directly into the detection process (i.e., MCs tend to appear in small clusters). We model the MCs by a marked point process (MPP) in which spatially neighboring MCs are interactive with each other. The detection is achieved through maximum a posteriori (MAP) estimation of the parameters of the MPP model. The proposed approach was evaluated with a dataset of 141 clinical mammograms, and the results show that it could yield improved performance compared with a recently proposed SVM detector.
  • Keywords
    mammography; maximum likelihood estimation; medical image processing; pattern clustering; clustered microcalcification detection; mammogram images; marked point process; maximum a posteriori estimation; spatial clustering property; spatial distribution modeling; spatial point-process modeling approach; Breast cancer; Calcium; Cancer detection; Clustering algorithms; Detectors; Lesions; Object detection; Parameter estimation; Support vector machine classification; Support vector machines; Clustered microcalcifications; computer-aided detection; marked point process; spatial point process;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing (ICIP), 2009 16th IEEE International Conference on
  • Conference_Location
    Cairo
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4244-5653-6
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2009.5414063
  • Filename
    5414063