DocumentCode
3488020
Title
Detection of high frequency regions in multiresolution
Author
Mota, Virgínia Fernandes ; De Almeida Perez, Eder ; De Castro, Tássio Knop ; Chapiro, Alexandre ; Vieira, Marcelo Bernardes
Author_Institution
DCC/ICE, Univ. Fed. de Juiz de Fora, Juiz de Fora, Brazil
fYear
2009
fDate
7-10 Nov. 2009
Firstpage
2165
Lastpage
2168
Abstract
We propose a method for the detection of high frequency regions using multiresolution analysis and orientation tensors. A scalar field representing multiresolution edges is obtained. Local maxima of this scalar space indicate regions having coincident detail vectors in multiple scales of a wavelet decomposition. This is useful for finding edges, textures, collinear structures and salient regions for computer vision methods. The image is decomposed into several scales using the discrete wavelet transform (DWT). The resulting detail spaces form vectors indicating intensity variations which are adequately combined using orientation tensors. The multivariate data of the resulting tensor field provides fair estimations of high frequency regions. Using these tensors, a positive scalar is computed for each original image pixel. Our results show that this descriptor indicates areas having relevant intensity variation in multiple scales.
Keywords
computer vision; discrete wavelet transforms; edge detection; image resolution; tensors; collinear structures; computer vision methods; discrete wavelet transform; high frequency region detection; image pixel; intensity variations; multiresolution analysis; multiresolution edges; multivariate data; orientation tensors; positive scalar; tensor field; wavelet decomposition; Brightness; Computer vision; Data mining; Discrete wavelet transforms; Frequency estimation; Ice; Image edge detection; Multiresolution analysis; Signal resolution; Tensile stress; high frequency detection; multiresolution analysis; multiresolution edges; orientation tensor;
fLanguage
English
Publisher
ieee
Conference_Titel
Image Processing (ICIP), 2009 16th IEEE International Conference on
Conference_Location
Cairo
ISSN
1522-4880
Print_ISBN
978-1-4244-5653-6
Electronic_ISBN
1522-4880
Type
conf
DOI
10.1109/ICIP.2009.5414074
Filename
5414074
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