Title :
Robust FPGA resynthesis based on fault-tolerant Boolean matching
Author :
Hu, Yu ; Feng, Zhe ; He, Lei ; Majumdar, Rupak
Author_Institution :
Electr. Eng. Dept., Univ. of California, Los Angeles, CA
Abstract :
We present FPGA logic synthesis algorithms for stochastic fault rate reduction in the presence of both permanent and transient defects. We develop an algorithm for fault tolerant Boolean matching (FTBM), which exploits the flexibility of the LUT configuration to maximize the stochastic yield rate for a logic function. Using FTBM, we propose a robust resynthesis algorithm (ROSE) which maximizes stochastic yield rate for an entire circuit. Finally, we show that existing PLB (programmable logic block) templates for area-aware Boolean matching and logic resynthesis are not effective for fault tolerance, and propose a new robust template with path re-convergence. Compared to the state-of-the-art academic technology mapper Berkeley ABC, ROSE using the proposed robust PLB template reduces the fault rate by 25% with 1% fewer LUTs, and increases MTBF (mean time between failures) by 31%, while preserving the optimal logic depth.
Keywords :
Boolean functions; fault tolerance; field programmable gate arrays; logic devices; stochastic processes; FPGA resynthesis; fault tolerant Boolean matching; logic synthesis algorithms; programmable logic block; stochastic fault rate reduction; stochastic yield rate; Boolean functions; Circuit faults; Fault tolerance; Field programmable gate arrays; Logic functions; Programmable logic arrays; Programmable logic devices; Robustness; Stochastic processes; Table lookup;
Conference_Titel :
Computer-Aided Design, 2008. ICCAD 2008. IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-2819-9
Electronic_ISBN :
1092-3152
DOI :
10.1109/ICCAD.2008.4681654