Title :
Scanning Kelvin probe microscopy of electrode-semiconducting polymer interfaces
Author :
Taylor, D.M. ; Martinez, F.G. ; Cambridge, J.A. ; Morris, D. ; Wraich, M. ; Faria, G.
Author_Institution :
Sch. of Informatics, Univ. of Wales, Bangor, UK
Abstract :
The application of scanning Kelvin probe microscopy to polymer-electrode interfaces is described for a range of different device situations. Polarization effects arising from ionic drift are identified. Ohmic and rectifying contacts in lateral diodes are investigated as well as a MISFET with one Schottky contact.
Keywords :
MISFET; Schottky barriers; diodes; electrodes; interface phenomena; ohmic contacts; organic semiconductors; rectification; scanning probe microscopy; MISFET; Schottky contact; electrode-semiconducting polymer interfaces; ionic drift; lateral diodes; ohmic contacts; polarization effects; rectifying contacts; scanning Kelvin probe microscopy; Aluminum; Atomic force microscopy; Electrodes; Kelvin; MISFETs; Metal-insulator structures; Polarization; Polymers; Probes; Surface topography;
Conference_Titel :
Electrets, 2005. ISE-12. 2005 12th International Symposium on
Print_ISBN :
0-7803-9116-0
DOI :
10.1109/ISE.2005.1612410
