A discrete software reliability growth model with testing effort

Author

Kapur, P.K. ; Xie, Min ; Garg, R.B. ; Jha, A.K.

Author_Institution

Dept. of Oper. Res., Delhi Univ., India

fYear

1994

fDate

21-22 Dec 1994

Firstpage

16

Lastpage

20

Abstract

We propose a discrete software reliability growth model with testing effort. The behaviour of the testing effort is described by a discrete Rayleigh curve. Assuming that the discrete failure intensity to the amount of current testing effort is proportional to the remaining error content, we formulate the model as a non-homogeneous poisson process. Parameters of the model are estimated. We then discuss a release policy based on cost and failure intensity criteria. Numerical results are also presented

Keywords

numerical analysis; program testing; reliability theory; software reliability; stochastic processes; cost; discrete Rayleigh curve; discrete failure intensity; discrete software reliability growth model; model parameters; nonhomogeneous poisson process; numerical results; release policy; remaining error content; testing effort; Computer bugs; Cost function; Humans; Particle measurements; Phase detection; Phase measurement; Software measurement; Software quality; Software reliability; Software testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Software Testing, Reliability and Quality Assurance, 1994. Conference Proceedings., First International Conference on

Conference_Location

New Delhi

Print_ISBN

0-7803-2608-3

Type

conf

DOI

10.1109/STRQA.1994.526379

Filename

526379