Title :
A discrete software reliability growth model with testing effort
Author :
Kapur, P.K. ; Xie, Min ; Garg, R.B. ; Jha, A.K.
Author_Institution :
Dept. of Oper. Res., Delhi Univ., India
Abstract :
We propose a discrete software reliability growth model with testing effort. The behaviour of the testing effort is described by a discrete Rayleigh curve. Assuming that the discrete failure intensity to the amount of current testing effort is proportional to the remaining error content, we formulate the model as a non-homogeneous poisson process. Parameters of the model are estimated. We then discuss a release policy based on cost and failure intensity criteria. Numerical results are also presented
Keywords :
numerical analysis; program testing; reliability theory; software reliability; stochastic processes; cost; discrete Rayleigh curve; discrete failure intensity; discrete software reliability growth model; model parameters; nonhomogeneous poisson process; numerical results; release policy; remaining error content; testing effort; Computer bugs; Cost function; Humans; Particle measurements; Phase detection; Phase measurement; Software measurement; Software quality; Software reliability; Software testing;
Conference_Titel :
Software Testing, Reliability and Quality Assurance, 1994. Conference Proceedings., First International Conference on
Conference_Location :
New Delhi
Print_ISBN :
0-7803-2608-3
DOI :
10.1109/STRQA.1994.526379
