DocumentCode
3488771
Title
Software quality in medical devices-a top-down approach
Author
Leggingwell, D.A. ; Norman, Bonnie
Author_Institution
RELA Inc., Boulder, CO, USA
fYear
1993
fDate
13-16 Jun 1993
Firstpage
307
Lastpage
311
Abstract
The development of highly reliable software is key to the success of many of today´s medical devices and instruments. The development of such software is achieved through a phased development process that starts with requirements and ends when the product reaches the market. Quality medical software is achieved by applying verification and validation techniques throughout he different development phases. Verification and validation (V&V) has successfully been applied to software in military, aerospace, and medical systems. Because applied V&V yields highly reliable software in the demanding medical environment, verification and validation techniques represent the leading edge in achieving solid medical software quality. V&V is a proven method for producing quality software. Verification assures that each time a step is taken in the software development process, testing is performed to ensure that the step was done correctly. Validation compares the final product to the original specification. A software-controlled device that does not perform as expected may be acceptable in some industries. In the medical device field, defect-ridden software could prove to be fatal
Keywords
medical computing; program verification; quality control; software quality; software reliability; defect-ridden software; highly reliable software; medical devices; medical environment; phased development process; software development process; software-controlled device; solid medical software quality; validation techniques; Computer industry; Costs; Industrial accidents; Programming; Quality assurance; Quality management; Software development management; Software packages; Software quality; Software testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer-Based Medical Systems, 1993. Proceedings of Sixth Annual IEEE Symposium on
Conference_Location
Ann Arbor, MI
Print_ISBN
0-8186-3752-8
Type
conf
DOI
10.1109/CBMS.1993.263001
Filename
263001
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