Reflectivity calculation of a periodical-patch-loaded absorber by the FD-TD method

Author

Ojima, Takeyuki

Author_Institution

Commun. Res. Lab., Minist. of Posts & Telecommun., Koganei, Japan

Volume

1

fYear

1999

fDate

1999

Firstpage

340

Abstract

An objective of this paper is to show low reflectivity of a lossy material with periodical metal patches on the surface by FD-TD computations in addition to experiments. Symmetry conditions based on image theory have been introduced to reduce the computational volume. A uniaxial perfectly-matched-layer (UPML) is used as an absorbing boundary condition, which also reduces computer memory and calculation time. By the computations and experiments, the absorber of this kind is proved to have low reflectivity as a viable microwave absorber. It features potential versatility of design

Keywords

absorbing media; electromagnetic wave absorption; finite difference time-domain analysis; inhomogeneous media; microwave materials; reflectivity; FD-TD method; absorbing boundary condition; computational volume reduction; computer memory reduction; experiments; image theory; lossy material; microwave absorber; near to far field transformation; periodical metal patches; periodical-patch-loaded absorber; reflectivity calculation; symmetry conditions; uniaxial perfectly-matched-layer; Conductivity; Inorganic materials; Magnetic confinement; Message-oriented middleware; Permittivity; Polynomials; Reflection; Reflectivity; Strips; Surface waves;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 1999 IEEE International Symposium on

Conference_Location

Seattle, WA

Print_ISBN

0-7803-5057-X

Type

conf

DOI

10.1109/ISEMC.1999.812924

Filename

812924