Title :
Burst immunity tests according to IEC 1000-4-4 standard used to improve design of a new integrated power function
Author :
Magnon, D. ; Feybesse, A. ; Guitton, F.
Author_Institution :
Power Microelectron. Lab., Tours, France
Abstract :
Any electronics application has to satisfy immunity requirements concerning electromagnetic perturbations. This immunity can be ratified by the IEC 1000-4-4 standard, which does not allow for the testing of a single device. In order to achieve the results, we had to design a test method. The results we got from a new integrated power function are satisfactory for they confirm the reliability of the device and allow us to keep or improved the design
Keywords :
IEC standards; electromagnetic interference; electron device testing; measurement standards; power integrated circuits; AC switches; ACS402; EMI; IEC 1000-4-4 standard; application specific discrete device; burst immunity tests; electromagnetic perturbations; electronics application; immunity requirements; integrated power function design; Electronic equipment testing; Home appliances; IEC standards; Immunity testing; Lithography; Pulse generation; Switches; Switching circuits; Variable speed drives; Voltage;
Conference_Titel :
Electromagnetic Compatibility, 1999 IEEE International Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-5057-X
DOI :
10.1109/ISEMC.1999.812926
