The use of raster scanner in failure analysis of advanced memory devices

Author

Eng-Cheang, Tan ; Swee-Thian, Teh

Author_Institution

Adv. Micro Devices Export, Penang, Malaysia

fYear

1996

fDate

26-28 Nov 1996

Firstpage

35

Lastpage

39

Abstract

One major problem in failure analysis of integrated circuits is to correlate the test datalog to the precise failure mode. Production testers and test programs are optimized to reduce test time, and thus electrical failures are classified in terms of very gross categories of parametric, functional, programming and AC failures. This paper presents the use of raster scanner, low cost PC-based equipment for detailed characterization of electrical failure modes on nonvolatile and programmable logic devices, in failure analysis of advanced memory devices

Keywords

automatic testing; failure analysis; integrated circuit testing; integrated memory circuits; production testing; programmable logic devices; AC failures; PC-based equipment; advanced memory devices; electrical failures; failure analysis; functional failures; nonvolatile logic devices; parametric failures; precise failure mode; production testers; programmable logic devices; programming failures; raster scanner; test datalog; test programs; test time; Circuit faults; Circuit testing; Debugging; Failure analysis; History; Nonvolatile memory; Production; Programmable logic devices; Space vector pulse width modulation; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Semiconductor Electronics, 1996. ICSE '96. Proceedings., 1996 IEEE International Conference on

Conference_Location

Penang

Print_ISBN

0-7803-3388-8

Type

conf

DOI

10.1109/SMELEC.1996.616447

Filename

616447