Title :
Self-isolation NMOS-DMOS technology for automotive low-side switches
Author :
Fujihira, T. ; Yoshida, K. ; Mizuno, T. ; Sakurai, K. ; Uchida, Y.
Author_Institution :
Fuji Electr. Co. Ltd., Nagano, Japan
Abstract :
A self-isolation NMOS-DMOS technology has been developed and successfully applied to an automotive intelligent power MOSFET low-side switch. Though self-isolation technology provides a cost-effective approach for intelligent power switches (IPSs), there are strict limitations for usable device structures and device connections. The limitations are tightest in the case of low-side IPSs. To overcome these limitations, an over-temperature detection circuit, a current limiting circuit, a dynamic clamping circuit, and an electrostatic surge protection method have been developed for self-isolation low-side IPSs. The principles of these circuits and experimental results are presented together with an outline of self-isolation NMOS-DMOS technology. The applicability of self-isolation NMOS-DMOS technology to high voltage and/or IGBT (insulated-gate bipolar transistor) type IPSs is also demonstrated
Keywords :
automotive electronics; insulated gate bipolar transistors; insulated gate field effect transistors; semiconductor switches; IGBT; automotive intelligent power MOSFET; automotive low-side switches; current limiting circuit; dynamic clamping circuit; electrostatic surge protection method; intelligent power switches; over-temperature detection circuit; self-isolation NMOS-DMOS technology; Automotive engineering; Clamps; Current limiters; Insulated gate bipolar transistors; Intelligent structures; Intelligent vehicles; MOSFET circuits; Power MOSFET; Switches; Vehicle dynamics;
Conference_Titel :
Power Semiconductor Devices and ICs, 1991. ISPSD '91., Proceedings of the 3rd International Symposium on
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-0009-2
DOI :
10.1109/ISPSD.1991.146109