• DocumentCode
    3489623
  • Title

    Self-isolation NMOS-DMOS technology for automotive low-side switches

  • Author

    Fujihira, T. ; Yoshida, K. ; Mizuno, T. ; Sakurai, K. ; Uchida, Y.

  • Author_Institution
    Fuji Electr. Co. Ltd., Nagano, Japan
  • fYear
    1991
  • fDate
    22-24 Apr 1991
  • Firstpage
    242
  • Lastpage
    247
  • Abstract
    A self-isolation NMOS-DMOS technology has been developed and successfully applied to an automotive intelligent power MOSFET low-side switch. Though self-isolation technology provides a cost-effective approach for intelligent power switches (IPSs), there are strict limitations for usable device structures and device connections. The limitations are tightest in the case of low-side IPSs. To overcome these limitations, an over-temperature detection circuit, a current limiting circuit, a dynamic clamping circuit, and an electrostatic surge protection method have been developed for self-isolation low-side IPSs. The principles of these circuits and experimental results are presented together with an outline of self-isolation NMOS-DMOS technology. The applicability of self-isolation NMOS-DMOS technology to high voltage and/or IGBT (insulated-gate bipolar transistor) type IPSs is also demonstrated
  • Keywords
    automotive electronics; insulated gate bipolar transistors; insulated gate field effect transistors; semiconductor switches; IGBT; automotive intelligent power MOSFET; automotive low-side switches; current limiting circuit; dynamic clamping circuit; electrostatic surge protection method; intelligent power switches; over-temperature detection circuit; self-isolation NMOS-DMOS technology; Automotive engineering; Clamps; Current limiters; Insulated gate bipolar transistors; Intelligent structures; Intelligent vehicles; MOSFET circuits; Power MOSFET; Switches; Vehicle dynamics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs, 1991. ISPSD '91., Proceedings of the 3rd International Symposium on
  • Conference_Location
    Baltimore, MD
  • ISSN
    1063-6854
  • Print_ISBN
    0-7803-0009-2
  • Type

    conf

  • DOI
    10.1109/ISPSD.1991.146109
  • Filename
    146109