DocumentCode :
348986
Title :
Switching-off phenomena in an L-C-R network
Author :
Finkelstein, I. ; Axelrod, Alex ; Joffe, Elya B.
Author_Institution :
EMI Test Lab., Israel
Volume :
1
fYear :
1999
fDate :
1999
Firstpage :
549
Abstract :
Voltage transients on power leads, protected by L-C-R filters, due to a switching-on event, were discussed in our previous paper. In this paper the transient effects in L-C-R circuits at switching-off events are investigated, with emphasis on the overvoltage transients developed across the terminals of the switching device, and transients across the power line leads of the output ports of the L-C-R filter. In addition, the gradual transition of the solid state device from “on” to “off”, states and the consequent time dependent behavior of its dynamic impedance are investigated. It is shown that a gradual variation of the switch resistance results in a drastic reduction of the overvoltage amplitude. The analysis demonstrated that an oscillatory process may be developed during the switch-off event, primarily due to the series resonant circuit composed of the series filter inductor and the switch parasitic capacitance, however, under certain circuit conditions, the transient process may be a-periodic. Results of this investigation can be applied for the optimization of L-C-R filter networks, and for the proper selection of switching elements
Keywords :
circuit resonance; network analysis; overvoltage; passive filters; switching transients; L-C-R filter networks; dynamic impedance; optimization; oscillatory process; output ports; overvoltage amplitude reduction; power line leads; series filter inductor; series resonant circuit; solid state device; switch parasitic capacitance; switch resistance; switch-off event; switching device terminals; switching elements; switching-off phenomena; time dependent behavior; voltage transients; Filters; Impedance; Inductors; Parasitic capacitance; Protection; RLC circuits; Solid state circuits; Switches; Switching circuits; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 1999 IEEE International Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-5057-X
Type :
conf
DOI :
10.1109/ISEMC.1999.812965
Filename :
812965
Link To Document :
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