• DocumentCode
    3489897
  • Title

    Thermal analysis automation system for semiconductor package

  • Author

    Zhang, Yuanxiang ; Liang, Lihua ; Xia, Yangjian ; Liu, Yong ; Irving, Scott ; Luk, Timwah

  • Author_Institution
    Fairchild-ZJUT Joint Lab., Zhejiang Univ. of Technol., Hangzhou
  • fYear
    2008
  • fDate
    20-23 April 2008
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    The technology of thermal analysis is very important in development of a new generation of IC package design, which aims to obtain the temperature distribution and thermal resistance of package. Most IC design engineers and package engineers have many difficulties in performing thermal analysis because they are familiar with the product structure but poor in thermal-physical modeling and FEA skills. To assist IC design engineers and package engineers to perform thermal analysis efficiently and accurately, a fully automation system (WBExcel) that has the ability to complete the whole package thermal analysis automatically has been developed based on ANSYSreg Workbench and Excel. The WBExcel consist of four modules: a Package Model Information Library, an executable Wizard System, a Package Material Library and an Environment Library. The general methodology of developing this automation system is introduced. The application on PCB level analysis and component level analysis is presented and indicates the reliability and efficiency of WBExcel.
  • Keywords
    integrated circuit packaging; printed circuits; semiconductor device packaging; temperature measurement; ANSYS Workbench; IC design; IC package design; PCB level analysis; WBExcel automation system; Wizard System; environment library; package material library; package model information library; semiconductor package; temperature distribution; thermal analysis automation system; thermal resistance; thermal-physical modeling; Automation; Design engineering; Integrated circuit modeling; Integrated circuit packaging; Libraries; Performance analysis; Semiconductor device packaging; Temperature distribution; Thermal engineering; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Micro-Systems, 2008. EuroSimE 2008. International Conference on
  • Conference_Location
    Freiburg im Breisgau
  • Print_ISBN
    978-1-4244-2127-5
  • Electronic_ISBN
    978-1-4244-2128-2
  • Type

    conf

  • DOI
    10.1109/ESIME.2008.4525028
  • Filename
    4525028