DocumentCode
3489897
Title
Thermal analysis automation system for semiconductor package
Author
Zhang, Yuanxiang ; Liang, Lihua ; Xia, Yangjian ; Liu, Yong ; Irving, Scott ; Luk, Timwah
Author_Institution
Fairchild-ZJUT Joint Lab., Zhejiang Univ. of Technol., Hangzhou
fYear
2008
fDate
20-23 April 2008
Firstpage
1
Lastpage
7
Abstract
The technology of thermal analysis is very important in development of a new generation of IC package design, which aims to obtain the temperature distribution and thermal resistance of package. Most IC design engineers and package engineers have many difficulties in performing thermal analysis because they are familiar with the product structure but poor in thermal-physical modeling and FEA skills. To assist IC design engineers and package engineers to perform thermal analysis efficiently and accurately, a fully automation system (WBExcel) that has the ability to complete the whole package thermal analysis automatically has been developed based on ANSYSreg Workbench and Excel. The WBExcel consist of four modules: a Package Model Information Library, an executable Wizard System, a Package Material Library and an Environment Library. The general methodology of developing this automation system is introduced. The application on PCB level analysis and component level analysis is presented and indicates the reliability and efficiency of WBExcel.
Keywords
integrated circuit packaging; printed circuits; semiconductor device packaging; temperature measurement; ANSYS Workbench; IC design; IC package design; PCB level analysis; WBExcel automation system; Wizard System; environment library; package material library; package model information library; semiconductor package; temperature distribution; thermal analysis automation system; thermal resistance; thermal-physical modeling; Automation; Design engineering; Integrated circuit modeling; Integrated circuit packaging; Libraries; Performance analysis; Semiconductor device packaging; Temperature distribution; Thermal engineering; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Micro-Systems, 2008. EuroSimE 2008. International Conference on
Conference_Location
Freiburg im Breisgau
Print_ISBN
978-1-4244-2127-5
Electronic_ISBN
978-1-4244-2128-2
Type
conf
DOI
10.1109/ESIME.2008.4525028
Filename
4525028
Link To Document