• DocumentCode
    3490094
  • Title

    Detection of single-charge polarisation in silicon double quantum dots by using serially-connected multiple single-electron transistors

  • Author

    Kawata, Yoshiyuki ; Oda, Shunri ; Tsuchiya, Yoshishige ; Mizuta, Hiroshi

  • Author_Institution
    Quantum Nanoelectron. Res. Center, Tokyo Inst. of Technol., Tokyo
  • fYear
    2008
  • fDate
    15-19 Sept. 2008
  • Firstpage
    322
  • Lastpage
    325
  • Abstract
    We investigate novel serially-connected multiple single-electron transistors (MSETs) as a single-charge polarisation readout for silicon integrated charge qubits. We first design and analyse the double single-electron transistors (DSETs) in which double quantum dots are connected in series with two side gates. We show that the DSETs are sufficiently sensitive to distinguish all the single-charge polarisation states on the two charge qubits integrated adjacently. We also show the scalability of the MSETs by extending our analysis to a scaled-up system of serial triple single-electron transistors (TSETs) integrated with triple charge qubits. Finally we fabricate the DSETs with double charge qubits on the silicon-on-insulator substrate and observe hysteresis in the Coulomb oscillations of the tunnel current at temperature of 4.2 K, which are attributable to the change of polarisation in the double charge qubits.
  • Keywords
    elemental semiconductors; semiconductor device models; semiconductor quantum dots; silicon; single electron transistors; Coulomb oscillations; Si; double quantum dots; hysteresis; serially-connected multiple single-electron transistors; silicon integrated charge qubits; silicon-on-insulator substrate; single-charge polarisation readout; tunnel current; Capacitance; Circuit simulation; Computational modeling; Electrodes; Hysteresis; Polarization; Quantum computing; Quantum dots; Silicon on insulator technology; Single electron transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 2008. ESSDERC 2008. 38th European
  • Conference_Location
    Edinburgh
  • ISSN
    1930-8876
  • Print_ISBN
    978-1-4244-2363-7
  • Electronic_ISBN
    1930-8876
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2008.4681763
  • Filename
    4681763