DocumentCode
3490094
Title
Detection of single-charge polarisation in silicon double quantum dots by using serially-connected multiple single-electron transistors
Author
Kawata, Yoshiyuki ; Oda, Shunri ; Tsuchiya, Yoshishige ; Mizuta, Hiroshi
Author_Institution
Quantum Nanoelectron. Res. Center, Tokyo Inst. of Technol., Tokyo
fYear
2008
fDate
15-19 Sept. 2008
Firstpage
322
Lastpage
325
Abstract
We investigate novel serially-connected multiple single-electron transistors (MSETs) as a single-charge polarisation readout for silicon integrated charge qubits. We first design and analyse the double single-electron transistors (DSETs) in which double quantum dots are connected in series with two side gates. We show that the DSETs are sufficiently sensitive to distinguish all the single-charge polarisation states on the two charge qubits integrated adjacently. We also show the scalability of the MSETs by extending our analysis to a scaled-up system of serial triple single-electron transistors (TSETs) integrated with triple charge qubits. Finally we fabricate the DSETs with double charge qubits on the silicon-on-insulator substrate and observe hysteresis in the Coulomb oscillations of the tunnel current at temperature of 4.2 K, which are attributable to the change of polarisation in the double charge qubits.
Keywords
elemental semiconductors; semiconductor device models; semiconductor quantum dots; silicon; single electron transistors; Coulomb oscillations; Si; double quantum dots; hysteresis; serially-connected multiple single-electron transistors; silicon integrated charge qubits; silicon-on-insulator substrate; single-charge polarisation readout; tunnel current; Capacitance; Circuit simulation; Computational modeling; Electrodes; Hysteresis; Polarization; Quantum computing; Quantum dots; Silicon on insulator technology; Single electron transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Device Research Conference, 2008. ESSDERC 2008. 38th European
Conference_Location
Edinburgh
ISSN
1930-8876
Print_ISBN
978-1-4244-2363-7
Electronic_ISBN
1930-8876
Type
conf
DOI
10.1109/ESSDERC.2008.4681763
Filename
4681763
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