• DocumentCode
    3490188
  • Title

    High frequency asymptotic analysis of modal excitation at flanged parallel plane waveguides

  • Author

    Abe, Yuji ; Shirai, Hiroshi ; Sato, Ryoichi

  • Author_Institution
    Grad. Sch. of Sci. & Eng., Chuo Univ., Tokyo, Japan
  • fYear
    2012
  • fDate
    1-3 Aug. 2012
  • Firstpage
    377
  • Lastpage
    380
  • Abstract
    Ray analysis has been executed for obtaining modal excitation coefficients at the flanged parallel plane waveguides. Previously derived formula has been extended to include multiple edge diffraction contributions between the aperture edges. By comparing the results by other methods, it has been shown that the contribution due to the doubly edge diffracted rays can improve the excitation coefficients for the transitional waveguide mode.
  • Keywords
    electromagnetic wave diffraction; electromagnetic wave scattering; waveguides; aperture edges; doubly edge diffracted rays; electromagnetic scattering; excitation coefficients; flanged parallel plane waveguides; high frequency asymptotic analysis; modal excitation; modal excitation coefficients; multiple edge diffraction; ray analysis; transitional waveguide mode; Couplings; Diffraction; Educational institutions; Electromagnetic scattering; Planar waveguides;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications and Electronics (ICCE), 2012 Fourth International Conference on
  • Conference_Location
    Hue
  • Print_ISBN
    978-1-4673-2492-2
  • Type

    conf

  • DOI
    10.1109/CCE.2012.6315932
  • Filename
    6315932