DocumentCode
3490188
Title
High frequency asymptotic analysis of modal excitation at flanged parallel plane waveguides
Author
Abe, Yuji ; Shirai, Hiroshi ; Sato, Ryoichi
Author_Institution
Grad. Sch. of Sci. & Eng., Chuo Univ., Tokyo, Japan
fYear
2012
fDate
1-3 Aug. 2012
Firstpage
377
Lastpage
380
Abstract
Ray analysis has been executed for obtaining modal excitation coefficients at the flanged parallel plane waveguides. Previously derived formula has been extended to include multiple edge diffraction contributions between the aperture edges. By comparing the results by other methods, it has been shown that the contribution due to the doubly edge diffracted rays can improve the excitation coefficients for the transitional waveguide mode.
Keywords
electromagnetic wave diffraction; electromagnetic wave scattering; waveguides; aperture edges; doubly edge diffracted rays; electromagnetic scattering; excitation coefficients; flanged parallel plane waveguides; high frequency asymptotic analysis; modal excitation; modal excitation coefficients; multiple edge diffraction; ray analysis; transitional waveguide mode; Couplings; Diffraction; Educational institutions; Electromagnetic scattering; Planar waveguides;
fLanguage
English
Publisher
ieee
Conference_Titel
Communications and Electronics (ICCE), 2012 Fourth International Conference on
Conference_Location
Hue
Print_ISBN
978-1-4673-2492-2
Type
conf
DOI
10.1109/CCE.2012.6315932
Filename
6315932
Link To Document