• DocumentCode
    3490276
  • Title

    Effective thermal modeling of discrete components under peak-pulsed power loading by subdomain consideration

  • Author

    Noijen, S.P.M. ; Eggink, H.J.

  • Author_Institution
    Philips Appl. Technol. High Tech, Eindhoven
  • fYear
    2008
  • fDate
    20-23 April 2008
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Power diodes are subjected to massive sudden peak- pulsed powers (hundreds of watts for milliseconds) boosting junction temperatures within the diode package. If the maximum junction temperature is exceeded, the diode fails. To develop safe designs it is therefore of great importance to predict the diode\´s thermal behavior under peak-pulsed power loads. Due to the peak-pulsed thermal loading and poor thermal conductivity of the diode\´s encapsulation, thermal finite element (FE) analysis is very time-consuming. The small time scale of the transient thermal effect requires a high level of mesh refinement to capture the peak temperature effects, but at the same time the "far field" is undisturbed. In this work, the encapsulation effect on the total discrete package transient thermal behavior is approximated by a semi-analytic approach and taken into account in the FE model. This is done by applying time-dependent semi-infinite boundary conditions on a sub domain for the thermal solution, while the thermo-mechanical analysis is applied to the entire domain. Results are compared to an alternative approach which makes use of semi-infinite elements. It will be shown that the sub-domain consideration approach greatly reduces simulation time without significantly affecting the outcome of the calculations.
  • Keywords
    diodes; encapsulation; finite element analysis; power semiconductor devices; thermal analysis; transient analysis; discrete components; discrete package transient thermal behavior; finite element analysis; maximum junction temperature; peak-pulsed power loading; power diodes; semianalytic approach; thermal modeling; time dependent semiinfinite boundary conditions; transient thermal effect; Boosting; Boundary conditions; Diodes; Encapsulation; Finite element methods; Packaging; Temperature; Thermal conductivity; Thermal loading; Thermomechanical processes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Micro-Systems, 2008. EuroSimE 2008. International Conference on
  • Conference_Location
    Freiburg im Breisgau
  • Print_ISBN
    978-1-4244-2127-5
  • Electronic_ISBN
    978-1-4244-2128-2
  • Type

    conf

  • DOI
    10.1109/ESIME.2008.4525054
  • Filename
    4525054