DocumentCode
3490297
Title
An accurate and robust approach for evaluating VIE impedance matrix elements using SWG basis functions
Author
Hu, Li ; Li, Le-Wei ; Yeo, Tat-Soon ; Vahldieck, Ruediger
Author_Institution
Nat. Univ. of Singapore, Singapore
fYear
2008
fDate
16-20 Dec. 2008
Firstpage
1
Lastpage
4
Abstract
In this paper, we present an iterative, efficient and accurate method for calculating singularities of both order 1/R and order 1/R2 involved in the MoM solution of VIE. In our method, a sufficient number of terms from Green´s functions are subtracted so that the remainder is at least once continuously differentiable so as to enable the standard Gaussian quadrature method to be applicable. Similar ideas have been applied for surface integration problems in previous articles, here it is a further extension. Compared to the usual singularity extraction method which only extracts one term, the present method could significantly improve the accuracy of singular integral calculations. Compact iterative formulas are also derived and given here so that arbitrary terms of singularities can be subtracted and calculated analytically, which greatly facilitates its numerical implementation in the MoM procedure and also extendable to integral equation fast solvers.
Keywords
Gaussian processes; Maxwell equations; computational electromagnetics; electromagnetic wave scattering; integral equations; method of moments; Green´s functions; MoM solution; SWG basis function; Schaubert-Wilton-Glisson functions; VIE impedance matrix element; singularity extraction method; standard Gaussian quadrature method; surface integration problem; volume integral equation; Green´s function methods; Impedance; Integral equations; Magnetic analysis; Magnetic materials; Magnetic separation; Maxwell equations; Reluctance generators; Robustness; Transmission line matrix methods;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 2008. APMC 2008. Asia-Pacific
Conference_Location
Macau
Print_ISBN
978-1-4244-2641-6
Electronic_ISBN
978-1-4244-2642-3
Type
conf
DOI
10.1109/APMC.2008.4958486
Filename
4958486
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