Title :
A new full-wave hybrid differential-integral approach for the investigation of multilayer structures including nonuniformly doped diffusions
Author :
Wane, S. ; Bajon, D. ; Baudrand, H. ; Gamand, P.
Author_Institution :
ENSEEIHT, Toulouse, France
Abstract :
A new hybrid integral-differential approach is presented for fullwave investigations of multilayer structures including nonuniformly doped diffusions. The proposed approach allow an accurate prediction of substrate noise mechanisms in combining the advantages of both the integral (homogeneous parts) and differential (inhomogeneous parts) approaches. Realistic test structures are investigated and the obtained results are successfully compared to published measurements and commercial software results. Original isolation strategies using oxide trench and isolated pockets diffused around sensitive blocks are proposed and demonstrate high isolation capabilities for epitaxial technologies.
Keywords :
doping profiles; integro-differential equations; isolation technology; multilayers; substrates; commercial software results; differential-integral approach; epitaxial technology; full-wave hybrid approach; fullwave investigation; high isolation capability; homogeneous parts; inhomogeneous parts; isolated pocket diffusion; isolation strategy; multilayer structure investigation; nonuniformly doped diffusions; oxide trench; published measurement; realistic test structures; sensitive blocks; substrate noise mechanism prediction; BiCMOS integrated circuits; Boundary conditions; Circuit testing; Integral equations; Integrated circuit noise; Nonhomogeneous media; Semiconductor device noise; Software testing; Substrates; Surface impedance;
Conference_Titel :
Microwave Symposium Digest, 2004 IEEE MTT-S International
Print_ISBN :
0-7803-8331-1
DOI :
10.1109/MWSYM.2004.1338830